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A Photoelectrochemical Cell Based on Atomic Force Microscopy and Scanning Electrochemical Microscopy

A technology of atomic force microscope and scanning electrochemistry, which is applied in the direction of scanning probe technology, scanning probe microscopy, scientific instruments, etc., can solve the problems that the external excitation light source cannot be introduced, and achieve strong light source adjustability, stable system, good stability effect

Active Publication Date: 2021-12-14
DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The electrochemical cell supporting the atomic force microscope can only test a small number of thin samples, and cannot introduce an external excitation light source

Method used

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  • A Photoelectrochemical Cell Based on Atomic Force Microscopy and Scanning Electrochemical Microscopy
  • A Photoelectrochemical Cell Based on Atomic Force Microscopy and Scanning Electrochemical Microscopy
  • A Photoelectrochemical Cell Based on Atomic Force Microscopy and Scanning Electrochemical Microscopy

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Embodiment Construction

[0039] The present invention will be further described in detail below in conjunction with the embodiments.

[0040] like figure 1 A schematic diagram of an in situ photoelectrochemical cell based on the combination of atomic force microscopy and scanning electrochemical microscopy. Including the electrochemical cell main body 4 made of quartz material and the cover sheet 1 made of transparent insulating material; the electrochemical cell main body and the cover sheet are sealed by O-ring 2 and tightly connected with sealant; the electrochemical cell There is a cylindrical protrusion 7 in the middle of the main body to support the sample to be tested. The upper open end of the container is provided with an annular upper cover sheet 1 with a through hole in the middle, the lower surface of which is sealed and connected to the open end surface of the quartz container.

[0041] Its inner bottom surface is provided with an arc-shaped counter electrode Pt wire, the arc-shaped cou...

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Abstract

The invention discloses an in-situ photoelectrochemical cell based on an atomic force microscope and a scanning electrochemical microscope. The main body of the in-situ cell is an integrated quartz chemical cell, an O-ring, and a cover sheet, which are stacked and sealed from bottom to top to prevent liquid leakage. The integrated quartz chemical cell includes a magnet groove that stabilizes the entire system and supports the sample to be tested. There is an arc-shaped opening on the edge of the cover, and the fiber optic probe is coupled to the arc-shaped opening. The incident light can be gathered to the sample under the probe, and the side lighting also eliminates the influence of the shadow of the probe, which meets the requirements of in-situ photoelectrochemical testing. The advantage of the present invention is that it breaks through the limitations of commercial electrochemical cells that can only use a few thinner samples and cannot add an external light source. Through the integrated adjustment of the in-situ cell and the coupling of optical fiber channels, it is possible to perform in-situ photoelectrochemical imaging on the surface of photoelectric materials. characterization. In addition, the invention has the advantages of simple use and operation, a wide range of characterization materials and good stability.

Description

technical field [0001] The invention relates to the technical field of photoelectric catalysis in-situ liquid imaging, in particular to a method for scanning electrochemical activity imaging on the surface of a photoelectric material and its application. Background technique [0002] The submerged scanning electrochemical imaging technology is a technology that uses (nano) micrometer electrodes to scan the surface of the sample and detects electrochemical current imaging of reactive species on the surface by applying a bias to the electrode, which is in situ electrochemical imaging. Scanning electrochemical imaging is a technique mainly used for active site imaging of electrochemistry and photoelectrochemistry. Atomic force microscopy can accurately obtain the topography of the sample surface. Scanning electrochemical imaging combined with atomic force microscopy can simultaneously obtain information on the morphology and electrochemical activity of the substrate, which can...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N27/416G01Q60/24G01Q60/60
CPCG01N27/416G01Q60/24G01Q60/60
Inventor 李灿聂伟王珣范峰滔
Owner DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI