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Method for selectively and epitaxially growing germanium in deep silicon groove

A selective, deep silicon trench technology, used in the manufacture of electrical components, diodes, semiconductor/solid-state devices, etc., can solve problems such as reducing optical coupling efficiency, and achieve the effect of improving coupling efficiency

Pending Publication Date: 2021-11-16
杨荣
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this method will insert a SiO2 barrier layer between the silicon waveguide and the germanium material, which will reduce the coupling efficiency of light.

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  • Method for selectively and epitaxially growing germanium in deep silicon groove
  • Method for selectively and epitaxially growing germanium in deep silicon groove
  • Method for selectively and epitaxially growing germanium in deep silicon groove

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Embodiment Construction

[0025] The present invention will be further described below in conjunction with the accompanying drawings.

[0026] When epitaxially growing germanium in deep silicon trenches, the growth window has very thick exposed silicon sidewalls (depending on the thickness of the silicon trench). Because any exposed crystalline silicon surface can be used as a growth area for germanium, germanium will grow on the sidewall, affecting the epitaxial morphology and epitaxial quality. In the prior art, germanium epitaxy on the side wall is avoided by forming a SiO2 barrier layer on the side wall. However, this method will insert a SiO2 barrier layer between the silicon waveguide and the germanium material, which will reduce the coupling efficiency of light. In order to solve the above problems, this scheme is proposed, as follows:

[0027] like figure 1 , Figure 2(a)-Figure 2(h) As shown, this embodiment proposes a method for selective epitaxy of germanium in deep silicon trenches, inc...

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Abstract

The invention provides a method for selectively and epitaxially growing germanium in a deep silicon groove. The method comprises the following steps of: 1, depositing a hard mask on the surface of a silicon substrate, and manufacturing a deep silicon groove; 2, selectively and epitaxially growing germanium on the side wall and the bottom of the deep silicon groove at the same time; 3, performing high-temperature annealing to redistribute the germanium material on the side wall; 4, repeating the steps 2-3 to enable the epitaxial growth germanium surface at the deep silicon groove to be higher than the hard mask; 5, performing chemical mechanical polishing to enable the germanium surface to be flush with the surface of the hard mask; and 6, removing the hard mask, and completing selective epitaxial germanium of the deep silicon groove. According to the method provided by the invention, germanium / germanium-silicon epitaxy is carried out on the side wall and the bottom of the silicon groove at the same time, and the germanium / germanium-silicon epitaxy growth in the deep silicon groove can be realized under the condition that the morphology is not influenced by using a high-temperature germanium redistribution technology; and a silicon oxide layer does not need to be inserted between silicon and germanium, so that the coupling efficiency from a silicon waveguide to a germanium device is improved.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a method for selectively epitaxial germanium in a deep silicon groove. Background technique [0002] The ability to selectively grow germanium on specific regions of a silicon substrate facilitates the integration of germanium-based optoelectronic devices with silicon-based high-speed optoelectronic integrated circuits. Potential applications include integrating high-performance germanium photodetectors, silicon optical modulators, and various silicon optical passive devices to form optical transceiver chips with high-speed transceiver functions. In addition to germanium detectors, both Ge and Ge / SiGe quantum wells (QW) exhibit electroabsorption effects (Franz effect), namely the Keldysh effect in Ge and the quantum confinement Stark effect (QCSE) in Ge / SiGe. An increase in the applied electric field redshifts the absorption spectrum, a behavior that allows the develop...

Claims

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Application Information

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IPC IPC(8): H01L21/762H01L27/142
CPCH01L21/02381H01L21/02532H01L21/02636H01L21/3247H01L21/30625H01L27/142
Inventor 杨荣
Owner 杨荣