Super-junction IGBT device structure with enhanced carrier concentration and manufacturing method
A technology of carrier concentration and device structure, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve problems such as large conduction voltage drop, reduce conduction voltage drop, and increase carrier concentration , The effect of reducing the width of the table
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Embodiment 1
[0073] An embodiment of a superjunction IGBT device with enhanced carrier concentration, such as figure 2 As shown, it includes: a collector metal 1, a P-type collector region 2, and an N-type field stop layer 3 stacked in sequence from bottom to top, and a super-junction N column 5 and a super-junction N column 5 are arranged above the N-type field stop layer 3. The super junction P column 4 contacted by the column 5, the first trench structure located above the super junction N column 5, the first trench structure includes a gate dielectric layer 6 and a gate electrode 7 inside the gate dielectric layer 6;
[0074] There is a P-type floating area 13 above the super-junction P column 4, and a P-type base area 8 is located on the upper part of the super-junction N column 5; the P-type base area 8 is located on the left side of the trench structure, and the P-type floating area 13 is located in the trench On the right side of the structure, the upper part of the P-type base reg...
Embodiment 2
[0104] An embodiment of a superjunction IGBT device with enhanced carrier concentration, such as image 3 As shown, the difference between this embodiment and Embodiment 1 is that the depth of the P-type floating region 13 exceeds the depth of the first trench structure.
[0105] The deeper P-type floating region helps to improve the electric field distribution at the bottom of the trench and improve device reliability.
Embodiment 3
[0107] An embodiment of a superjunction IGBT device with enhanced carrier concentration, such as Figure 4 As shown, the difference between this embodiment and Embodiment 1 is that an N-type charge storage layer 17 is introduced into the super junction N pillar 5 below the P-type base region 8, and the junction depth of the N-type charge storage layer 17 is smaller than that of the first For the depth of the trench structure, the concentration of the N-type charge storage layer 17 exceeds the concentration of the superjunction N pillars.
[0108] The introduction of the N-type charge storage layer further increases the concentration of carriers, enhances the conductance modulation effect of the drift region, and reduces the conduction voltage drop of the device.
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