AlGaN-based deep ultraviolet LED epitaxial structure of In-Si co-doped quantum well and preparation method of AlGaN-based deep ultraviolet LED epitaxial structure
An epitaxial structure and co-doping technology, applied in semiconductor devices, electrical components, circuits, etc., can solve the problems of poor material quality and unsatisfactory reliability, reduce non-radiative recombination centers, improve internal quantum efficiency, and improve reliability sexual effect
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Embodiment 1
[0026] Embodiment 1: A method for preparing an In-Si co-doped quantum well AlGaN-based deep ultraviolet LED epitaxial structure provided in this embodiment comprises the following steps:
[0027] (1) Place the C-face sapphire as the substrate in the MOCVD graphite carrier plate, and place it at a temperature of 1200-1400°C, a pressure of 75-200torr, and a H 2 and N 2 Under the condition of mixed gas as carrier gas, wash for 5 minutes;
[0028] (2) At a temperature of 950°C, a pressure of 80torr, a V / III ratio of 1000, and a H 2 and N 2 Under the condition of mixed gas as carrier gas, Al source and ammonia gas are passed into the reaction chamber to grow a low-temperature AlN buffer layer with a thickness of 300nm;
[0029] (3) At a temperature of 1300°C, a pressure of 80torr, a V / III ratio of 1000, and a H 2 and N 2 Under the condition of mixed gas as the carrier gas, the Al source and ammonia gas are passed into the reaction chamber to grow a high-temperature AlN layer w...
Embodiment 2
[0037] Embodiment 2: A method for preparing an In-Si co-doped quantum well AlGaN-based deep ultraviolet LED epitaxial structure provided in this embodiment includes the following steps:
[0038] (1) Place the C-face sapphire as the substrate in the MOCVD graphite carrier plate, and place it at a temperature of 1200-1400°C, a pressure of 75-200torr, and a H 2 and N 2 Under the condition of mixed gas as carrier gas, wash for 5 minutes;
[0039] (2) At a temperature of 950°C, a pressure of 80torr, a V / III ratio of 1000, and a H 2 and N 2 Under the condition of mixed gas as carrier gas, Al source and ammonia gas are passed into the reaction chamber to grow a low-temperature AlN buffer layer with a thickness of 300nm;
[0040] (3) At a temperature of 1300°C, a pressure of 80torr, a V / III ratio of 1000, and a H 2 and N 2 Under the condition of mixed gas as the carrier gas, the Al source and ammonia gas are passed into the reaction chamber to grow a high-temperature AlN layer wi...
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