Board card testing device and testing system
A test device and board technology, which is applied in the direction of measurement device, electronic circuit test, measurement of electricity, etc., can solve the problems of inability to perform long-term stability monitoring and recording, inability to automate the test process, and low test efficiency, so as to improve the test efficiency and Test reliability, reduce test time, reduce the effect of human error
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Embodiment 1
[0047] The present embodiment provides a board testing device, which includes a signal generation unit and a signal acquisition unit; the signal generation unit is used to generate an excitation signal, and sends the excitation signal to the board to be tested and the signal acquisition unit; The collection unit is used to collect the response signal generated by the board to be tested based on the excitation signal, and generate a test result based on the excitation signal and the response signal.
[0048] The signal generation unit in this embodiment can be a waveform generator, which is used to generate various excitation signals input by the analog external nuclear test signal processing system, and send the excitation signals to the board card to be tested and the signal acquisition unit; The board needs to test various functions, so it is necessary to simulate and generate various corresponding excitation signals for the board under test to generate corresponding response...
Embodiment 2
[0059] This embodiment is a specific implementation of embodiment 1, figure 1 It is a schematic diagram of a signal processing flow of a board test device provided by an embodiment of the present invention.
[0060] In the board test device of the present embodiment, its excitation signal is an electric pulse signal; The board test device also includes a pulse amplification unit for amplifying the electric pulse signal; the signal generation unit is used to send the excitation signal by the pulse amplification unit to the signal acquisition unit.
[0061] In this embodiment, the signal generation unit is a waveform generator, and the signal acquisition unit is an oscilloscope; as figure 1 As shown, the waveform generator 1 generates an electric pulse signal, and sends the electric pulse signal to the board to be tested 2, and the board to be tested 2 responds to and processes the electric pulse signal, outputs the electric pulse response signal and sends the electric pulse re...
Embodiment 3
[0064] This embodiment is a specific implementation of embodiment 1, figure 2 It is a schematic diagram of a signal processing flow of a board test device provided by an embodiment of the present invention.
[0065] The excitation signal of the board test device of the present embodiment is an electrical pulse signal; the board test device also includes a photoelectric conversion unit 5 and a pulse amplification unit 3; the photoelectric conversion unit 5 is used to convert the electrical pulse signal into an optical pulse signal; the pulse amplification Unit 3 is used to amplify the optical pulse signal; the signal generation unit is used to send the excitation signal to the board to be tested through the photoelectric conversion unit; the signal generation unit is also used to send the excitation signal to the signal through the photoelectric conversion unit and the pulse amplification unit Acquisition unit.
[0066] Such as figure 2 As shown, in this embodiment, the wav...
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