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Nonvolatile SRAM unit based on hafnium-based ferroelectric capacitor

A ferroelectric capacitor, non-volatile technology, applied in the field of non-volatile SRAM cells, can solve the problems of being easily affected by the process, low data recovery accuracy, low reliability, etc.

Pending Publication Date: 2022-03-22
NINGBO UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Document 1 (C Liu, Q Wang and J.Y Yang et al. IEEE International Conference on Solid-State & Integrated Circuit Technology, p.1-3 (2020). A NVSRAM with a 7T1C structure is disclosed. In this NVSRAM, 6 CMOS The device constitutes 6T SRAM, 1 CMOS and 1 hafnium-based ferroelectric capacitor constitute 1T1C ferroelectric memory, that is, non-volatile memory. Although the NVSRAM stores and restores data quickly and consumes low power, it passes 1T1C ferroelectric memory To save and restore the data in 6T SRAM, the accuracy of data recovery is low, and it is easily affected by the process, and the reliability is low

Method used

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  • Nonvolatile SRAM unit based on hafnium-based ferroelectric capacitor
  • Nonvolatile SRAM unit based on hafnium-based ferroelectric capacitor
  • Nonvolatile SRAM unit based on hafnium-based ferroelectric capacitor

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Embodiment

[0013] Example: such as figure 1 As shown, a non-volatile SRAM cell based on hafnium-based ferroelectric capacitors, including 6T SRAM and non-volatile memory modules, 6T SRAM includes a bit line BL for reading and writing, and a word line WL for gating access , the reverse phase line BLB for reading and writing, the first PMOS transistor PM1, the second PMOS transistor PM2, the first NMOS transistor NM1, the second NMOS transistor NM2, the third NMOS transistor NM3 and the fourth NMOS transistor NM4, the first The source of the PMOS transistor PM1 and the source of the second PMOS transistor PM2 are both connected to the power supply voltage VDD, the drain of the first PMOS transistor PM1, the gate of the second PMOS transistor PM2, the drain of the first NMOS transistor NM1, and the drain of the second PMOS transistor PM1. The drain of the second NMOS transistor NM2 is connected to the gate of the third NMOS transistor NM3, and its connection end is the first storage node of...

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Abstract

The nonvolatile SRAM unit comprises a 6T SRAM and a nonvolatile storage module, the nonvolatile storage module comprises a fifth NMOS (N-channel metal oxide semiconductor) tube, a sixth NMOS tube, a seventh NMOS tube, an eighth NMOS tube, a first hafnium-based ferroelectric capacitor and a second hafnium-based ferroelectric capacitor and is of a 4T2C structure, and in the nonvolatile storage module, the first hafnium-based ferroelectric capacitor is connected with the second hafnium-based ferroelectric capacitor. A pair of hafnium-based ferroelectric capacitors, namely a first hafnium-based ferroelectric capacitor and a second hafnium-based ferroelectric capacitor, is adopted as nonvolatile memory devices to form a complementary bilateral structure, data in a 6T SRAM (Static Random Access Memory) is stored in the first hafnium-based ferroelectric capacitor and the second hafnium-based ferroelectric capacitor before power failure, and then the circuit is completely turned off, so that the standby power consumption is saved, and the power consumption is reduced. A complementary bilateral structure formed by the first hafnium-based ferroelectric capacitor and the second hafnium-based ferroelectric capacitor can improve the data recovery rate and the reliability of resisting process change; the method has the advantages of being high in data recovery rate and good in reliability of resisting process changes.

Description

technical field [0001] The invention relates to a nonvolatile SRAM unit, in particular to a nonvolatile SRAM unit based on a hafnium-based ferroelectric capacitor. Background technique [0002] Non-volatile SRAM (NVSRAM) is formed by integrating CMOS SRAM with non-volatile memory (NVM) in one cell. NVSRAM generally has three working modes: normal SRAM mode, storage mode and recovery mode. In normal SRAM mode, NVSRAM works as a SRAM unit to complete the reading, writing and retention of data in CMOS SRAM; in storage mode, when NVSRAM is powered off, it stores the data in CMOS SRAM in NVM, and the data will not be lost after power off; In the recovery mode, the data stored in the NVM is restored to the CMOS SRAM when the NVSRAM is powered on. Compared with the method of using a non-volatile system composed of a centralized NVM core, NVSRAM realizes bit-to-bit, parallel data transmission, fast storage and recovery of data, and low power consumption. Document 1 (C Liu, Q Wang...

Claims

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Application Information

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IPC IPC(8): G11C11/22
CPCG11C11/221G11C11/2293G11C11/2297
Inventor 张跃军李憬戴晟傅晟杰
Owner NINGBO UNIV
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