Unlock instant, AI-driven research and patent intelligence for your innovation.

Intelligent regulation and control method and system based on Q-time tolerant interval station disconnection

A control system and site technology, applied in the direction of comprehensive factory control, comprehensive factory control, electrical program control, etc., can solve problems such as downstream equipment failure, scrapped wafer manufacturing unit products, and idle equipment, etc., to improve product flow rate and The effect of reducing the production cycle, reducing human error prediction, and reducing idle time

Pending Publication Date: 2022-04-08
SHANGHAI HUALI MICROELECTRONICS CORP
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The first purpose of the present invention is to aim at the prior art, the traditional wafer manufacturing unit product (Lot) relies on the production line personnel to judge whether the downstream site is disconnected when scheduling the Q-time initial site, and checks the operation of each site by experience or manual appointment When the production line changes suddenly, the Q-time interval changes or the process is updated, the relevant information cannot be obtained systematically, which leads to the risk of scrapping and re-operation of the wafer manufacturing unit product (Lot); when the equipment plan During maintenance, use experience to determine when the wafer manufacturing unit product (Lot) is not in operation at the Q-time start site, resulting in the risk of scrapping and re-operation of the wafer manufacturing unit product (Lot) within the Q-time time interval; It is impossible to scientifically predict the resumption time when resuming the machine, so that it is impossible to release the goods at the Q-time starting site in time, resulting in the inability of the downstream equipment to work when resuming the machine, causing the equipment to be idle, thus affecting the production capacity and other defects. Provide a Q-time based capacity Intelligent control method for station disconnection in time interval

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Intelligent regulation and control method and system based on Q-time tolerant interval station disconnection
  • Intelligent regulation and control method and system based on Q-time tolerant interval station disconnection
  • Intelligent regulation and control method and system based on Q-time tolerant interval station disconnection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] In order to illustrate the technical content, structural features, achieved goals and effects of the present invention in detail, the following will be described in detail in conjunction with the embodiments and accompanying drawings.

[0029] see figure 1 , figure 1 Shown is the flow chart of the present invention based on the Q-time tolerance interval site disconnection intelligent control method. The intelligent regulation and control method based on Q-time tolerant time interval site disconnection includes:

[0030] Execute step S1: Merge the first connected Q-time intervals of the three layers to form nested Q-time time intervals, and obtain the scheduling method determined according to the risk level after the combination of the starting station and the downstream disconnection station;

[0031] Execute step S2: Detect the equipment status of each operation site in the multi-layer Q-time time interval for each wafer manufacturing unit product (Lot);

[0032] Ex...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An intelligent regulation and control method based on Q-time tolerant interval station disconnection comprises the steps that three layers of Q-time intervals connected end to end are combined, a nested Q-time tolerant interval is formed, and a regulation and control mode judged according to the risk level after a starting station and a downstream disconnection station are combined is obtained; aiming at each Lot, detecting the equipment condition of each operation site in the multi-layer Q-time tolerance interval; for each Lot, simulating and predicting the workable condition of a device operation program corresponding to each site in the multi-layer Q-time tolerance interval; for each Lot, simulating and predicting information of each operation site in the multi-layer Q-time tolerance interval; and storing disconnection information of each work station in the Q-time tolerance interval, marking the regulation and control mode, forming a running path (Run Path) set which is used for mapping each station in the Q-time tolerance interval by a wafer manufacturing unit product (Lot), and judging whether dispatching can be carried out or not. According to the method, the dispatching accuracy can be improved, human error pre-judgment is reduced, the re-operation probability is reduced, the idle time after equipment is reset is shortened, and the product circulation rate and the production cycle are improved.

Description

technical field [0001] The present invention relates to the technical field of semiconductor manufacturing, in particular to an intelligent control method and system based on a Q-time tolerance time interval site disconnection. Background technique [0002] Due to the process requirements in the semiconductor integrated circuit wafer manufacturing process, the longest waiting time (Queue Time, Q-time) needs to be set at some sites, especially key sites, and it is required to go from a certain site (Q-time starting site) to Between another station (Q-time end station), it is necessary to enter the Q-time end station machine for operation within the set time; if the set time exceeds the set time and does not enter the machine work at the Q-time end station, the wafer manufacturing unit The product (Lot) has the risk of being scrapped or reworked (Rework), which leads to an increase in wafer production costs and even affects the timely delivery of products. [0003] Therefore,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/418G06Q10/04G06Q10/06G06Q10/10G06F16/906
CPCY02P90/02
Inventor 刘欣欣张峰何瑜艾伟光程杰
Owner SHANGHAI HUALI MICROELECTRONICS CORP