ATE device based on dynamic transmission parameters and transmission method

Abstract

The invention discloses an ATE device based on dynamic transmission parameters and a transmission method. The ATE device comprises a test program module, a compiler, a variable code module and a test execution module. The variable code module is used for receiving test conditions; the compiler is used for compiling a program in the test program module to form an executable first machine instruction part, and the test execution module comprises a grammar parser ATPL, a virtual machine unit CVM, a scheduling test flow unit and a communication unit; reading a test condition source code sentence by sentence by a grammar parser ATPL, firstly carrying out lexical analysis and grammar analysis, then converting the source code into an intermediate code, optimizing the intermediate code, finally explaining the intermediate code into an executable second machine instruction part, and executing the executable second machine instruction part by a virtual machine unit CVM; and the test flow scheduling unit schedules a test flow according to an execution result of the CVM, and executes an interactive test with the DUT through the communication unit.

Description

technical field [0001] The present invention relates to the field of semiconductor automatic test equipment (Automatic Test Equipment, ATE for short), in particular to an ATE device and transmission method based on dynamic transmission parameters. Background technique [0002] Chip testing plays an extremely important role in the entire semiconductor industry chain. As the complexity of integrated circuits increases, so does the complexity of testing. Large-scale integrated circuits often require hundreds of voltage, current, and timing tests and millions of functional test steps to ensure the completeness of the device. Correct, this also makes the test cost of the chip higher and higher, and the test cost of some devices even accounts for the vast majority of the chip cost. [0003] Automatic test equipment is a collection of test instruments controlled by a high-performance computer. It is a test system composed of a tester and a computer. The computer controls the test ...

AI Technical Summary

Problems solved by technology

Due to the characteristics of the compiled language, once the test program is modified, the entire test needs to be recompiled, linked and executed to take effect for the changed test conditions, which makes the debugging efficiency low and the development time becomes lengthy

If the test program is developed in an interpreted language, there are still most of the codes that are not frequently changed in the test program, so some performance will be lost

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