Preparation method of X-ray detector

A detector and X-ray technology, applied in the field of preparation of X-ray detectors, can solve problems such as poor performance of X-ray detectors, achieve the effects of improving carrier collection efficiency, improving electrical performance, and improving performance

Pending Publication Date: 2022-05-13
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide a method for preparing an X-ray detector to solve the problem of poor performance of existing X-ray detectors

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[0021] A preparation method of an X-ray detector, comprising the following steps:

[0022] S1. Use a ball mill to grind the perovskite and MXene bulk materials, and mix the ground perovskite and MXene powder materials evenly;

[0023] S2. Put the perovskite and MXene mixed powder material into a stainless steel mold, and use a manual tablet press to continuously apply a pressure of 20Mpa for 2 minutes to press the perovskite and MXene mixed powder material into a block with regular shape and dense surface;

[0024] S3, further using a cold isostatic press to apply a pressure of 200Mpa to the block prepared in step S2 for 15 minutes, and finally obtain a perovskite / MXene composite absorbent material with a dense cross-section;

[0025] S4. Finally, thermal evaporation equipment is used to evaporate electrodes on both sides of the perovskite / MXene composite absorption material obtained in step S3 to form an X-ray detector with a metal / semiconductor / metal structure.

[0026] In ...

Embodiment 1

[0028] A preparation method of an X-ray detector, comprising the following steps:

[0029] S1. Use a ball mill to grind the perovskite and MXene bulk materials, and mix the ground perovskite and MXene powder materials evenly;

[0030] S2. Put the perovskite and MXene mixed powder material into a stainless steel mold, and use a manual tablet press to continuously apply a pressure of 20Mpa for 2 minutes to press the perovskite and MXene mixed powder material into a block with regular shape and dense surface;

[0031] S3, further using a cold isostatic press to apply a pressure of 200Mpa to the block prepared in step S2 for 15 minutes, and finally obtain a perovskite / MXene composite absorbent material with a dense cross-section;

[0032] S4. Finally, thermal evaporation equipment is used to evaporate electrodes on both sides of the perovskite / MXene composite absorption material obtained in step S3 to form an X-ray detector with a metal / semiconductor / metal structure.

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Abstract

The invention discloses a preparation method of an X-ray detector, belongs to the technical field of photoelectric materials and devices, and aims at providing the preparation method of the X-ray detector to solve the problem that an existing X-ray detector is poor in performance. And the perovskite / MXene composite material with controllable quality and adjustable area thickness is prepared through a cold isostatic pressing technology. Through a material preparation technology and material performance regulation and control, the X-ray detector based on the perovskite / MXene composite material is prepared, and the performance of the X-ray detector is improved. The preparation method of the X-ray detector based on the perovskite / MXene composite absorption material is suitable for the preparation method of the X-ray detector based on the perovskite / MXene composite absorption material.

Description

technical field [0001] The invention belongs to the technical field of photoelectric materials and devices, and in particular relates to a preparation method of an X-ray detector. Background technique [0002] X-ray detectors are widely used in scientific research, national defense security, deep space exploration, medical imaging and many other fields. In particular, medical inspection has a huge demand for high-performance X-ray detectors. With the combination of artificial intelligence and medical imaging, the requirements for X-ray detector performance will be further improved. X-ray detectors can be divided into two categories: scintillator-based indirect detectors and semiconductor-based direct detectors. Direct X-ray detectors have the advantages of high spatial resolution and simple system structure. [0003] The core of the direct detector is the semiconductor absorbing layer, which needs to have a large average atomic number to block the absorption of X-rays, a l...

Claims

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Application Information

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IPC IPC(8): H01L51/48H01L51/46H01L51/42
CPCH10K71/00H10K85/30H10K30/30H10K2102/00Y02E10/549
Inventor 巫江魏顺勇任翱博沈凯
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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