Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

In-situ ionization mass spectrometry system and analysis method

An in-situ ionization, mass spectrometry system technology, applied in the direction of material analysis, analysis materials, and instruments by electromagnetic means, can solve the problems of low detection efficiency, poor universality, and high requirements for sample shape and size, and achieve detection efficiency. High, universal, the effect of improving the resolution

Pending Publication Date: 2022-08-02
NANJING NORMAL UNIVERSITY
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] In view of this, the technical problem to be solved by the present invention is that the existing DART-MS device cannot continuously analyze the surface of the sample, the detection efficiency is low, and the requirements for the shape and size of the sample are high, and the universality is poor

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • In-situ ionization mass spectrometry system and analysis method
  • In-situ ionization mass spectrometry system and analysis method
  • In-situ ionization mass spectrometry system and analysis method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0049] like figure 1 As shown, the in-situ ionization mass spectrometry system provided by this embodiment includes:

[0050] The ionization device 1 is used to desorb and ionize the compound to be tested on the surface of the sample 4 . The ionization device 1 is specifically a DART ion source. The ion source is mounted on the mounting frame 5 in a reflection mode so that it forms a certain inclination angle with the surface of the sample 4. The horizontal and vertical distances of the ion source relative to the sample 4 can be adjusted. . A restrictor 11 is also provided at the airflow outlet of the DART ion source, and the restrictor 11 has a channel for airflow, and the outlet aperture of the passage is smaller than the airflow outlet aperture of the DART ion source. The hot metastable particle flow generated by the ion source is concentrated and directed to the surface of the sample to be measured. The restrictor 11 in this embodiment is specifically a ceramic cap, whi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the field of analytical chemistry, and particularly relates to an in-situ ionization mass spectrometry system and an analysis method. The in-situ ionization mass spectrum system comprises an ionization device, a mass spectrum device and a sample platform arranged between the ionization device and the mass spectrum device, the sample platform comprises a sample plate and a fixing device, the sample plate is used for bearing a sample to be detected, and the fixing device is used for fixing the sample plate and can enable the sample plate to move in the horizontal direction. The in-situ ionization mass spectrometry system disclosed by the invention not only can continuously detect samples for multiple times, but also can be suitable for samples with different shapes and sizes, and has the advantages of high detection efficiency and good universality. The flow limiting piece is arranged at the airflow outlet of the ionization device, metastable state particle flow generated by the ionization device can be intensively led to the surface of the sample to be detected, and the resolution ratio of sample surface analysis is improved; the inlet transmission pipe of the mass spectrum device is arranged to be bent pipes with different angles, so that the ionized compound to be detected can be efficiently transmitted into the mass spectrum device for real-time analysis.

Description

technical field [0001] The invention belongs to the technical field of analytical chemistry, and particularly relates to an in-situ ionization mass spectrometry system and an analysis method for direct analysis of sample surfaces. Background technique [0002] The surface of the sample contains a lot of chemical information, such as whether the surfaces of fruits, vegetables, Chinese herbal medicines contain nutrients and pesticide residues, and whether the surfaces of packaging materials, plastic products, and fiber products contain toxic ingredients. Exploring the material composition information on the surface of samples is very important for human production and life. [0003] Traditional mass spectrometry-based methods, such as gas chromatography-mass spectrometry and liquid chromatography-mass spectrometry, cannot directly analyze the raw sample surface. These analyses require sample pretreatment processes such as extraction, centrifugation, and purification. The step...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/62
CPCG01N27/62
Inventor 李红丽赵正燕陈大勇
Owner NANJING NORMAL UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com