Check patentability & draft patents in minutes with Patsnap Eureka AI!

Memory equipment having page buffer storage with double-register and its use thereof

A page buffer and register technology, applied in the field of semiconductor memory devices, can solve the problems affecting the information storage characteristics of NAND type flash memory, etc., and achieve the effect of favorable backward replication, fast data storage, and memory performance improvement

Inactive Publication Date: 2006-02-08
SAMSUNG ELECTRONICS CO LTD
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the loading time greatly affects the information storage characteristics of NAND type flash memory

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Memory equipment having page buffer storage with double-register and its use thereof
  • Memory equipment having page buffer storage with double-register and its use thereof
  • Memory equipment having page buffer storage with double-register and its use thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] As described above, the present invention provides a semiconductor memory device and a method of using the same. The invention is described in detail herein.

[0047] Referring to FIG. 3, a memory device 100 fabricated in accordance with the present invention is depicted. The memory device 100 may be a NAND flash memory. The memory device 100 has a memory cell array 110 to store data, a page register and sense amplifier (S / A) block 120, and a Y gate circuit 130 for gating data stored in a group of memory cells. The page register and S / A block 120 is connected between the memory cell array 110 and the Y gate circuit 130 .

[0048] Page register and S / A block 120 includes page buffer 122 . The page buffer includes a dual register according to the present invention, which will be described in more detail below.

[0049] The device 100 also includes additional parts like X-buffer latches and decoders, Y-buffer latches and decoders, command registers, control logic and h...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A memory device has an array of memory cells to store data, and a Y-gating circuit to gate data stored in a group of the memory cells. A page buffer is coupled between the memory cell array and the Y-gating circuit. The page buffer includes a dual register corresponding to each memory cell of the group. The dual register includes a first register and an associated second register. The first and second registers are adapted to exchange data with each other, with cells of the memory cell array, and with the Y-gating circuit.

Description

[0001] This application claims priority to US Provisional Application No. 60 / 307572, filed July 23, 2001, which is hereby incorporated by reference. technical field [0002] The present invention relates to the field of semiconductor memory devices, more specifically flash memory devices having a page buffer circuit with double registers. Background technique [0003] Recent trends in semiconductor memory devices are high integration, large capacity, and support for high-speed system operation. These trends are equally directed to volatile memory (eg, dynamic random access memory (DRAM) and static random access memory (SRAM)) and nonvolatile memory (eg, flash memory). [0004] Flash memory is generally classified into a Not-NOR (NOR) type flash memory and a Not-NAND (NAND) type flash memory. NOR type flash memory is used in applications where small amounts of information must be read out of sequence at high speed, while ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G11C16/06G11C16/10G11C7/00G01R31/28G11C7/10G11C16/02G11C16/04G11C29/12
CPCG11C2216/14G11C16/10G11C7/1087G11C7/1093G11C7/1078G11C7/1039G11C7/1051G11C16/04
Inventor 任兴洙
Owner SAMSUNG ELECTRONICS CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More