Preparation method of X-ray diffraction sample rack

Abstract

The invention is a method for preparing X-rays in the material analysis test area of technology X beam diffraction sample manufacture method, the step follows: (1) choice of material; Sample choice monocrystal material, use crystal analyzer and laue diffraction technology determination monocrystal dense platoon crystallography plane; (2) cuts monocrystal sample semifinished materials, with the unit crystal dense platoon crystallography surface angle of departure, cuts the monocrystal piece as well as sample semifinished materials; (3) chemistry corrosion sample place; Using the hydrofluoric acid solution, corrodes the sample semifinished materials surface, corrodes the pit, at the same time uses the isolation material polyethylene, the region and the etching solution isolates the sample place outside; (4) but crystal sample and tinsel caking; Using the epoxy resin, and the tinsel carries on compound the monocrystal sample, obtains X beam diffraction sample frame, uses in X beam diffraction system, to was measured the sample diffraction information does not have any disturbance, enhances the measurement result the reliability, overcomes the easy embrittlement the shortcoming, lengthens the service life.

Description

technical field [0001] The invention relates to a preparation method used in the technical field of material analysis and testing, in particular to a preparation method of an X-ray diffraction sample holder. Background technique [0002] X-ray diffraction analysis technology has the advantage of being non-destructive, and truly represents the average effect of the detected area, and is the most effective means for studying the structure of materials. The diffractometer has been greatly developed in the past two decades, and the degree of automation has been significantly improved, but its key component, the sample holder, has not changed, and it still continues to use the quartz glass sample holder that has been used for decades. [0003] After searching the prior art documents, it was found that Liu Qiuchao and others published "Improvement of X-ray Diffractometer Sample Test Stand" in "Physical and Chemical Inspection Physics Volume" (2004, Volume 40, No. 11, Pages 583-584...

AI Technical Summary

Problems solved by technology

The material selection and preparation process of this type of sample holder is relatively simple. The disadvantage is that when the number of samples to be tested is small, the diffraction profile of quartz glass, aluminum or plasticine may appear, which interferes with the diffraction information of the sample to be tested and directly affects the diffraction analysis. reliability of results

And because the quartz glass material is brittle, it is prone to breakage during use

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