Process for precise arrangement of micro-bodies
a micro-organism and precise technology, applied in the field of process for precise arrangement of micro-organisms, can solve the problems of limited number of methods for arraying micro-organisms of small sizes, difficult to apply such methods to micro-organisms of 100 microns or less, and difficult to manipulate individual micro-organisms
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example 1
[0023]FIG. 1 exemplifies a process using a converging ion beam. This process comprises three steps: (a) of forming charged spots 3 on a substrate 2 by a converging ion beam 1; (b) of feeding micro-bodies 4 onto the charged spots 3; and (c) of arranging the micro-bodies 4 on the charged spots 3.
[0024] At the first step (a), for example, the charged positive spots 3 were formed on the insulating substrate 2 of calcium titanate ceramics by using a Ga−-converging ion beam at an acceleration voltage of 30 KV.
[0025]FIG. 2 exemplifies an image of the charged positive spots having a size of 5 microns which were formed on the substrate charged at an interval of 50 microns. The observation was made as a secondary-electron contrast image by using a scanning electron microscope of a low acceleration voltage (of 2.5 KV)
[0026] At the next step (b), as the micro-bodies to be arranged, microbodies 4, which were made of simply dispersed metal-coated spherical polymer particles having a diameter o...
example 2
[0028] Negatively charged spots are to be formed if a minute charged pattern can be formed by using a converging electron beam in place of the converging ion beam at the step (a) of FIG. 1. It was, therefore, confirmed that the minute charged pattern could be formed on the insulating substrate of calcium titanate ceramics by using the converging electron beam. A lattice pattern of an interval of 100 microns was drawn by using the converging electron beam of an acceleration voltage of 15 KV. FIG. 4 presents an observation with a scanning electron microscope of an acceleration voltage of 2 KV, that is, a secondary-electron contrast image of the charged pattern. A white lattice contrast pattern of an interval of 100 microns was observed. This contrast pattern implies the charge with the negative polarity and had a line width of about 20 microns. It can be conceived from this result that the charged spots couldbe formed by using the converging electron beam to arrange the particles of 2...
example 3
[0029]FIG. 5 shows a process for forming the charged spots by using a microprobe. In a construction comprising: a tungsten microprobe 1 (as will be abbreviated into the “probe”) having a leading end diameter of 2 microns; a polytetrafluorethylene thin film 2 having a thickness of 50 microns; a glass substrate (as will be abbreviated into the “substrate”) 3 treated to have a conductivity and a thickness of 1 mm; and a variable power supply 4 of rated 10 KV and 1 mA, the probe 1 was connected with the negative side of the power supply 4, and the substrate 3 was grounded to the earth. The thin film 2 was adhered to the substrate 3 by means of a conductive double-coated tape. At a first step a, therefore, the probe 1 was moved from a reference point on the substrate 3 to over a portion at which the charged spot was to be formed, and was so brought into contact with the thin film 2 that the thin film 2 might not be broken. At a next step b, the power supply 4 was used to apply a voltage ...
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