Unlock instant, AI-driven research and patent intelligence for your innovation.

Non-volatile memory cell

a non-volatile memory and cell technology, applied in the direction of electrical equipment, semiconductor devices, instruments, etc., can solve the problems of too large occupied memory cells b>10/b>, structural complexity, and inability to store data in non-volatile memory

Inactive Publication Date: 2005-08-18
EMEMORY TECH INC
View PDF22 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The solution enables efficient data storage with reduced chip area and manufacturing complexity, while preventing write interference and maintaining data integrity by using stacked dielectric layers and PMOS transistors, allowing for cost-effective and high-density memory solutions.

Problems solved by technology

However, as non-volatile memories become smaller in size, their gate oxide layers become accordingly thinner so that stored data vanishes easily, which causes a problem in the data storing ability of non-volatile memory.
Therefore, the conventional memory cell 10 occupies too large chip area and is structurally complicated, all of which increase the cost and difficulties in the manufacturing process.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Non-volatile memory cell
  • Non-volatile memory cell
  • Non-volatile memory cell

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] Please refer to FIG. 2 showing a memory cell 40 according to the present invention, and FIG. 3 showing a memory module 60 composed of the memory cells 40 shown in FIG. 2. The memory cell 40 includes a P-type substrate 42, an N-type well 44, three P-type doped regions 46, 48, 50, a first stacked dielectric layer 52, a first gate 54, a second stacked dielectric layer 56, and a second gate 58. The N-type well 44 is formed on the P-type substrate 42, the three P-type doped regions 46, 48, 50 are formed on the N-type well 44, the first stacked dielectric layer 52 is formed on the N-type well 44 and between the first doped region 46 and the second doped region 48 from among the three doped regions, the first gate 54 is formed on the first stacked dielectric layer 52, the second stacked dielectric layer 56 is formed on the N-type well 44 and between the second doped region 48 and the third doped region 50 from among the three doped regions, and the second gate 58 is formed on the se...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A memory cell is disclosed. The memory cell includes an N-well, three P-type doped regions formed on the N-type well, a first stacked dielectric layer formed on the N-type well and between a first doped region and a second doped region from among the three P-type doped regions, a first gate formed on the first stacked dielectric layer, a second stacked dielectric layer formed on the N-type well and between the second doped region and a third doped region from among the three P-type doped regions, and a second gate formed on the second stacked dielectric layer.

Description

Cross Reference To Related Applications [0001] This application is a division of pending U.S. application Ser. No. 10 / 707,700 filed Jan. 5, 2004.BACKGROUND OF INVENTION [0002] 1. Field of the Invention [0003] The present invention relates to a non-volatile memory cell, and more specifically, to a non-volatile memory cell having two transistors and a method for operating it. [0004] 2. Description of the Prior Art [0005] Non-volatile memory stores data even without a power supply so that it is widely used in various portable electronic products such as personal digital assistants (PDA), mobile phones, and memory cards. In order to respond to these requirements, non-volatile memory technology aims for compatibility with CMOS processing, low power consumption, high writing efficiency, low cost and high density. However, as non-volatile memories become smaller in size, their gate oxide layers become accordingly thinner so that stored data vanishes easily, which causes a problem in the da...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(United States)
IPC IPC(8): G11C16/04G11C16/10H01L29/76H01L29/792H10B20/00H10B69/00
CPCG11C16/0466G11C16/10H01L29/7923H01L27/11568H01L27/115H10B69/00H10B43/30
Inventor HSU, CHING-HSIANGSHEN, SHIH-JYECHEN, HSIN-MINGLEE, HAI-MING
Owner EMEMORY TECH INC