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Lndium antimonide opto-electronic sensor array quiescent operating point auto-calibration device

A photoelectric sensor, static operating point technology, applied in the field of photoelectric detection technology and electronics, can solve problems such as difficulty, large magnification, and labor and material resources consumption

Inactive Publication Date: 2009-10-28
ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, in an array detector, especially in an array with a relatively large number of units, it is not feasible mechanically to chop the optical signal, so the method of detecting continuous light is adopted, which requires: 1. The amplifier adopts a DC amplifier, And the magnification is very large (about 5000 times), which means that the temperature change of 0.5 degrees can saturate the amplifier
2. Even if the temperature compensation is carried out, due to the unstable temperature coefficient of each sensor, there must be residual errors that cannot be compensated. In the temperature range of the instrument (-30-30 degrees), the residual error is required to be smaller than the value required by the amplifier. very difficult
[0005] Therefore, it is necessary to design an amplifier static operating point adjustment circuit, which is generally adjusted by series and parallel resistors or sliding rheostats, but there are thousands of sensors in the entire InSb sensor array. If each element uses a manual sliding rheostat, when in The static operating point meets the conditions at a certain temperature. Once the ambient temperature changes, the static operating point needs to be recalibrated, which is very labor-intensive.

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  • Lndium antimonide opto-electronic sensor array quiescent operating point auto-calibration device
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Embodiment Construction

[0014] see figure 1 , figure 2 .

[0015] figure 2 Among them, U1 is PIC16F876A microcontroller of microchip company; U2 is RS-485 differential bus transceiver SN65LBC184; U3 is reference of indium antimonide sensor; U4 is electronic potentiometer X9241AYP; U5 is indium antimonide sensor unit; U6 is operational amplifier.

[0016] The 2(RA0), 3(RA1), 4(RA2), 5(RA3) pins of the microcontroller are respectively connected to the 4(A0), 16(A1), 5(A2), 15(A3) of the electronic potentiometer X9241AYP Pin, as the address line of X9241AYP.

[0017] The 26th pin of the MCU is connected with the 1st pin of SN65LBC184, the 24th pin of the MCU is connected with the 4th pin of SN65LBC184 as the serial port communication line; the 25th pin of the MCU is connected with the 2nd and 3rd pins of the SN65LBC184 as the transceiver control line of the serial port ; R3 is the matching resistor; J1 is the communication interface between the microcontroller and the computer.

[0018] The 14th ...

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Abstract

The invention discloses an automatic calibration device for the static working point of an indium antimonide photoelectric sensor array, comprising an indium antimonide photoelectric sensor array, characterized in that each indium antimonide photoelectric sensor in the indium antimonide photoelectric sensor array is connected to The structure of each calibration branch is as follows: the reference voltage VREF is output by the reference sensor, and then passes through the voltage divider circuit, one path is connected to the electronic potentiometer, and the other path is output to the first voltage follower. An address line, a communication clock line, and a communication data line are connected between the electronic potentiometer and the single-chip microcomputer; a communication connection is established between the acquisition card and the computer, and a communication connection is established between the computer and the single-chip microcomputer. After the automatic calibration device of the static working point, the sensor array can work normally in an environment with a temperature range of -30 to 40 degrees, which greatly improves its practicability.

Description

technical field [0001] The invention relates to the fields of photoelectric detection technology and electronics, in particular to an automatic calibration device for the static working point of an indium antimonide photoelectric sensor array. Background technique [0002] At present, indium antimonide is a direct semiconductor with a narrow bandgap width of 0.17eV at room temperature, indicating that it has a long-wavelength limit of spectral response greater than 7um, and the response time is an order of magnitude smaller than that of mercury cadmium telluride, reaching 10ns. At the same time, because the detector is made of InSb single crystal, it has stable performance and can work at room temperature without refrigeration. Therefore, the detector is simple in structure, small in size and easy to use, and is an ideal device for mid-infrared detection at present. [0003] However, the temperature coefficient of the indium antimonide photoconductive infrared detector is r...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/24G01J5/02G01J1/44G01J1/02
Inventor 谭逢富侯再红何枫吴毅
Owner ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI