An indium antimonide infrared focal plane array detector chip, which includes an antireflection film [6], a low-temperature glue [7], an indium antimonide photosensitive array [8], a silicon readout circuit [9], and an indium column [10] , InSb substrate [11]. Wherein, the indium antimonide photosensitive array [8] is provided with an antireflection film [6] on the back, and an indium pillar [10] is provided on the front. The other end of the indium column [10] is connected to the silicon readout circuit [9], and the backside of the silicon readout circuit [9] is provided with an indium antimonide substrate [11], and the indium antimonide photosensitive array [8], the silicon A low-temperature glue [7] is arranged in the gap between the readout circuit [9] and the indium column [10]. The indium antimonide infrared focal plane array detector chip of the invention achieves thermal matching with the indium antimonide photosensitive array and the silicon readout circuit, reduces strain, and makes the indium antimonide infrared focal plane array detector have higher reliability. In addition, the invention provides a method for manufacturing the indium antimonide infrared focal plane array detector chip.