Device for detecting 80C31 single particle effect

Abstract

The invention discloses a device for detecting 80C31 single event effect. A power module supplies power for a main detecting CPU and a detected 80C31; a current acquisition card acquires the current supplied for the detected 80C31 and sends the acquired current value to a host computer; when the current value exceeds the preset threshold value, latch happens; the host computer sends command to the power module and a power module 0 disconnects power of the detected 80C31; the main detecting CPU receives codes of test program from the host computer through a serial port and writes the received codes in SRAM; the detected 80C31 reads the codes from SRAM and operates the test program according to the read codes as well as stores the program operation results in a double-port RAM temporarily; the main detecting CPU extracts the operation results from the double-port RAM and sends the results of occurrence of single event upset to the host computer. The invention realizes the online downloading and revision of the test program with complete test contents and high device reliability.

Description

technical field [0001] The invention relates to a device for detecting CPU single-event effect, which belongs to the field of anti-radiation component effect. Background technique [0002] A single event event is an event in which a single high-energy particle in space, including heavy ions, high-energy protons, high-energy electrons or neutrons, bombards a microelectronic device, causing the logic function of the microelectronic device to be reversed or the device to be damaged. There are mainly single event reversal events and single event locking events. . A single event flip is a data bit flip caused by the ionization of high-energy charged particles in a semiconductor chip. Single event lockup is the deadlock of electronic components caused by energetic charged particles. [0003] With the development of my country's aerospace, nuclear weapons, nuclear submarines and other science and technology, the consequences of single event events on aerospace engineering are bec...

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Problems solved by technology

[0004] Chinese patent 200410083647.1 introduces a detector and method for detecting the ability of a microprocessor to resist single event events. The detector is a device used on a satellite, which uses a bus structure for data exchange, and the test program is solidified in the CPU under test. In the memory, it is only suitable for spaceborne system test and the program cannot be modified online. By comparing the initial value with the received data, it is judged whether the internal RAM has flipped. The test program is not subdivided into general data register test, special function register test, The internal working register and logic unit function test, which is not comprehensive for the research of CPU single event effect, and the wrong data is stored in the internal RAM of the tested CPU. Once the internal RAM of the tested CPU is flipped, it may cause CPU calculation errors, thus The experimental data is unreliable; the current detection part of the above patent uses a current limiter to collect

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