The utility model discloses a test circuit, a
chip and equipment. The test circuit comprises a first data selector, a sensing control scanning bypass and a logic unit, the first data selector comprises a first input end, a second input end and a first enabling end, the first input end is connected with a
signal output end of a sensing
control unit, the sensing control scanning bypass comprises storage units connected in a scanning chain mode, and the logic unit comprises a second enabling end and a second enabling end. One end of the logic unit is connected with the
signal receiving end of the sensing
control unit, the other end of the logic unit is connected with the second input end, and the logic unit is connected with the first enabling end and is configured to output a corresponding enabling
signal to the first enabling end in a first test mode; therefore, the first data selector selectively outputs a test signal of the sensing control scanning bypass or outputs a sensing signal of the sensing
control unit. Therefore, according to the embodiment of the invention, the operation parameters of the
chip in the test mode can be normally obtained on the premise of not influencing the
chip test, so that an analysis basis is provided for the
test failure reason of the chip.