Low-indium doping amount zinc oxide transparent conducting film and preparation method thereof
A technology of transparent conductive film and zinc oxide, which is applied to conductive materials, conductive materials, conductive layers on insulating carriers, etc., can solve the problems of high indium content and high cost, achieve low indium content, reduce indium content, and optimize film preparation The effect of process conditions
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Embodiment 1
[0015] Example 1: Multi-target co-sputtering magnetron sputtering to prepare a low-indium doped zinc oxide transparent conductive film.
[0016] The purity of the zinc oxide ceramic target for sputtering is 99.9%, the purity of the indium metal target is 99.9%, and the relative density is ~0.90. Install the targets in two opposite target guns (e.g. figure 1 (Shown), adjust the angle between the target gun and the vertical direction to ~30°, and evacuate until the background vacuum of the vacuum chamber is higher than 2.0×10 -4 Pa. With quartz glass as the substrate, the substrate temperature is kept at 400℃, 40sccm argon gas and 2sccm oxygen gas are passed into the vacuum chamber (sccm means standard milliliters per minute), the pressure of the vacuum chamber is adjusted to 0.5Pa, and the zinc oxide target corresponds to the RF power supply The power is adjusted to 150W, the power of the radio frequency power supply corresponding to the indium target is adjusted to 15W, the bias ...
Embodiment 2
[0018] The purity of the zinc oxide ceramic target for sputtering is 99.9%, the purity of the indium metal target is 99.9%, and the relative density is ~0.90. Install the targets in two opposite target guns (e.g. figure 1 (Shown), adjust the angle between the target gun and the vertical direction to ~30°, and evacuate until the background vacuum of the vacuum chamber is higher than 2.0×10 -4 Pa. Using ordinary alkali glass as the substrate, the substrate temperature is maintained at 400 ℃, 40sccm argon gas is passed into the vacuum chamber (sccm represents standard milliliters per minute), the pressure of the vacuum chamber is adjusted to 0.5Pa, and the power of the RF power supply corresponding to the zinc oxide target is adjusted It is 150W, the corresponding radio frequency power of the indium target is adjusted to 25W, the bias voltage is adjusted to -50V, and the sample rotation rate is 6 rpm. Under this condition, the film growth rate is ~22nm / min. The target material is b...
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