Method for manufacturing gallium nitride-based light-emitting diode with current barrier layer
A technology for light-emitting diodes and current blocking layers, applied in circuits, electrical components, semiconductor devices, etc., can solve problems such as inability to use dry etching technology, surface passivation of p-type gallium nitride-based epitaxial layers, and damage to epitaxial layers. Achieve the effect of avoiding damage and passivation problems
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[0028] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.
[0029] A method for manufacturing a GaN-based light-emitting diode with a current blocking layer, the manufacturing steps comprising:
[0030] Such as figure 1 As shown, a buffer layer 11, an n-GaN layer 12, an MQW multiple quantum well 13, a p-GaN layer 14 and a u-GaN layer 15 are epitaxially grown on a sapphire substrate 10 in sequence to form a nitrogen GaN-based light-emitting epitaxial layer.
[0031] Such as figure 2 As shown, a Ti / Au mask layer 20 is vapor-deposited on the u-GaN layer 15 by electron beam evaporation method, with a thickness of 50 / 100nm, and a current blocking region 200 with a diameter of 110 microns is defined by photolithography. The Ti / Au mask layer 20 outside the current blocking region 200 is removed by etching.
[0032] Such as image 3 As shown, the u-GaN layer 15 outside the current blocking region 200 is rem...
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