Method for manufacturing gallium nitride-based light-emitting diode with current barrier layer
A technology of light-emitting diodes and current blocking layers, applied in circuits, electrical components, semiconductor devices, etc., can solve the problems of inability to use dry etching technology, epitaxial layer damage, and surface passivation of p-type gallium nitride-based epitaxial layers. Achieve the effect of avoiding damage and passivation problems
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[0028] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.
[0029] A method for manufacturing a GaN-based light-emitting diode with a current blocking layer, the manufacturing steps comprising:
[0030] Such as figure 1 As shown, a buffer layer 11, an n-GaN layer 12, an MQW multiple quantum well 13, a p-GaN layer 14 and a u-GaN layer 15 are epitaxially grown on a sapphire substrate 10 in sequence to form a nitrogen GaN-based light-emitting epitaxial layer.
[0031] Such as figure 2 As shown, a Ti / Au mask layer 20 is vapor-deposited on the u-GaN layer 15 by electron beam evaporation method, with a thickness of 50 / 100nm, and a current blocking region 200 with a diameter of 110 microns is defined by photolithography. The Ti / Au mask layer 20 outside the current blocking region 200 is removed by etching.
[0032] Such as image 3 As shown, electrochemical etching is used to remove the u-GaN layer 15 outside th...
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