Unlock instant, AI-driven research and patent intelligence for your innovation.

Nonvolatile resistance-variable storage and preparation method thereof

A non-volatile, resistive change storage technology, applied in static memory, digital memory information, information storage, etc., can solve the problems of high energy consumption and high voltage, and achieve easy processing, simple structure, and stable high and low resistance state alternate transition The effect of the characteristic

Inactive Publication Date: 2011-02-09
INST OF PHYSICS - CHINESE ACAD OF SCI
View PDF3 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These materials have transition metal elements, the valence of the elements will change, and the semiconductor process compatibility is good, but the voltage of resistance transition of these materials is generally high (generally greater than 1V), so that the energy consumption is high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Nonvolatile resistance-variable storage and preparation method thereof
  • Nonvolatile resistance-variable storage and preparation method thereof
  • Nonvolatile resistance-variable storage and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0037] Example 1: Preparation of non-volatile resistive memory cells based on AgO thin films

[0038] (1) if figure 1 As shown, a silicon wafer is selected as the substrate 5, and then the substrate is fixed on the sample stage, and a layer of Cu thin film is prepared on the substrate 5 as the bottom electrode 4 by pulsed laser deposition;

[0039] (2) Prepare the AgO thin film 3 on the bottom electrode 4, the specific process is as follows: the target used can be a silver target or an AgO target, and the chamber of the deposition system is evacuated to 5×10 -4 Pa, fill the chamber with oxygen and keep the oxygen pressure at 100Pa and the substrate temperature at room temperature by adjusting the oxygen intake volume and the pumping volume of the mechanical pump; start the KrF excimer laser, focus the laser beam on the Ag target, and The working frequency is 6Hz, start to deposit AgO film; after 30 minutes of deposition, turn off the laser and end the deposition process;

[...

Embodiment 2

[0048] Embodiment 2: Based on Ag 3 o 2 Preparation of Thin Film Nonvolatile Resistive Memory Unit

[0049] (1) Select a silicon wafer as the substrate, then fix the substrate on the sample stage, and prepare a layer of Cu thin film on the substrate as the bottom electrode by pulsed laser deposition;

[0050] (2) prepare Ag on the bottom electrode 3 o 2 Thin film, the specific process is as follows: choose silver or Ag 3 o 2 target, the deposition system chamber was evacuated to 5×10 -4 Pa, fill the chamber with oxygen and keep the oxygen pressure at 200Pa and the substrate temperature at about 150°C by adjusting the oxygen intake volume and the pumping volume of the mechanical pump; start the KrF excimer laser and focus the laser beam on the Ag target , the laser operating frequency is 6Hz, start to deposit Ag 3 o 2 thin film; after 60 minutes of deposition, turn off the laser and end the deposition process;

[0051] (3) Using the pulsed laser deposition method on the...

Embodiment 3

[0053] Embodiment 3: Based on Ag 2 Fabrication of Nonvolatile Resistive Memory Cell Based on O Thin Film

[0054] (1) Select a silicon wafer as the substrate, then fix the substrate on the sample stage, and prepare a layer of Cu thin film on the substrate as the bottom electrode by pulsed laser deposition;

[0055] (2) prepare Ag on the bottom electrode 2 O thin film, the specific process is as follows: choose silver or Ag 2 O target, the chamber of the deposition system was evacuated to 5×10 -4 Pa, fill the chamber with oxygen and keep the oxygen pressure at 10Pa and the substrate temperature at about 300°C by adjusting the oxygen intake volume and the pumping volume of the mechanical pump; start the KrF excimer laser and focus the laser beam on the Ag target , the laser operating frequency is 6Hz, start to deposit Ag 2 O thin film; after 120 minutes of deposition, turn off the laser and end the deposition process;

[0056] (3) Using the pulsed laser deposition method on...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a nonvolatile resistance-variable storage unit and a manufacturing method thereof. The nonvolatile resistance-variable storage unit comprises an insulating substrate, a bottom electrode on the insulating substrate, a storage medium layer on the bottom electrode and a top electrode on the storage medium layer, wherein the storage medium layer is an AgxO film, and x is more than or equal to 1 and less than or equal to 2. In the nonvolatile resistance-variable storage unit, the AgxO (x is more than or equal to 1 and less than or equal to 2) film can be prepared at a low temperature, the voltage of resistance change is low (+ / -0.3V), and the film has the characteristic of automatically regulating the resistance change.

Description

technical field [0001] The present invention relates to the field of memory cells. Specifically, the present invention relates to a memory with non-volatile resistance switching effect and a preparation method thereof. Background technique [0002] In recent years, a resistive random access memory cell (RRAM) has received widespread attention. Its non-volatile storage method is: when current or voltage is applied to the metal / oxide / metal sandwich structure storage device, the resistance value of the device will change, and the resistance state can still be maintained after the external electric field is removed. , This phenomenon is called Colossal electroresistance effect, or CER effect for short. If the high-resistance state is stored as "0" and the low-resistance state is stored as "1", information can be stored. Compared with traditional storage units, RRAM has the advantages of simple structure, high storage density, low energy consumption, etc., and has broad applic...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L45/00G11C13/00H01L27/24
Inventor 尚大山董春颖孙继荣沈保根赵同云
Owner INST OF PHYSICS - CHINESE ACAD OF SCI