Controllable method for preparing atomic force microscope needlepoint with carbon nano tube

Abstract

The invention provides a process for preparing an atomic force microscope needlepoint by using single carbon nano tube. The process comprises the following steps of: depositing a metal nanoparticle on the microscope needlepoint by an electrochemical reduction method, placing the microscope needlepoint on which the metal nanoparticle is deposited upward, and performing fixed-point and oriented growth on the single carbon nano tube on the microscope needlepoint by a plasma enhanced chemical vapor deposition method. The obtained atomic force microscope needlepoint assembled with the single carbon nano tube can be used for atomic force microscope imaging.

Description

technical field [0001] The invention relates to a nanostructured atomic force microscope tip and a preparation method thereof, in particular to an atomic force microscope tip assembled with a single carbon nanotube and a preparation method thereof. Background technique [0002] Carbon nanotubes (Carbon nanotubes, CNTs) have attracted people's attention since they were discovered by Japanese scientist Iijima in arc discharge in 1991. They have extensive applications in composite materials, nanoelectronic devices, field emission displays, hydrogen storage materials, and probes. Potential application prospects. Carbon nanotubes are a new type of material with a complete molecular structure at the nanometer scale. They have a large aspect ratio, excellent electrical conductivity, thermal conductivity, good chemical stability and mechanical strength. The diameter of carbon nanotubes is very small, generally 2 to 20nm. At the same time, carbon nanotubes have incomparable flexibil...

AI Technical Summary

Problems solved by technology

When the traditional tapered AFM needle tip is worn, its radius of curvature will become larger and the resolution will be reduced. The imaging of the AFM is greatly affected by the probe. Therefore, with the development of nanotechnology, a higher performance AFM is required. emergence of probes

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