Field programmable gate array (FPGA)-based integrated circuit chip testing system and method

A technology for integrated circuit and chip testing, applied in the direction of digital circuit testing, electronic circuit testing, electrical measurement, etc., can solve the problems of strict cost control of chip testing, short design cycle, large shipment volume, etc., and achieve fast testing speed. , low cost and stable performance

Inactive Publication Date: 2011-09-14
建荣集成电路科技(珠海)有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, due to the high price of professional testing machines, domestic design companies are generally unwilling to invest a large amount of money in purchasing expensive equipment. At the same time, there are not many professional testing institutions in China, resulting in chip testing becoming a major bottleneck for products th

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  • Field programmable gate array (FPGA)-based integrated circuit chip testing system and method
  • Field programmable gate array (FPGA)-based integrated circuit chip testing system and method
  • Field programmable gate array (FPGA)-based integrated circuit chip testing system and method

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Embodiment 1

[0046] Such as figure 1 , figure 2 As shown, the present invention relates to an FPGA-based integrated circuit chip testing system and a method for testing integrated circuit chips with digital modules using the testing system. In this embodiment, the test system includes a PC, a main control chip, an FPGA chip, a configuration information storage device, a test vector storage device and a manipulator interface. The test vector storage device can be a U disk, SD card or MS card. Such as Figure 4As shown, the FPGA chip includes a CPU, a clock generator, a test vector memory, a timer, a removable storage interface, and a serial data interface. Between the PC and the main control chip, between the main control chip and the FPGA chip, between the main control chip and the configuration information storage device, between the PFGA chip and the test vector Connections are realized between the storage devices and between the FPGA chip and the chip to be tested. The manipulator...

Embodiment 2

[0058] The difference between this embodiment and Embodiment 1 is that: in addition to including digital modules, the chip to be tested also includes analog modules, and accordingly, the FPGA-based integrated circuit chip test system also includes analog parameters. module, the analog parameter module is used to test the analog parameter value of the chip to be tested, and transmit the test value to the FPGA chip. In the present embodiment, the test steps when using the FPGA-based integrated circuit chip test system to test the chip to be tested are as follows:

[0059] (a) The main control chip configures the FPGA chip with the configuration information stored in the configuration information storage device, and configures it as a control and data port processor corresponding to the chip to be tested;

[0060] (b) The main control chip sends a test command to the FPGA chip;

[0061] (c) After the FPGA chip receives the test command, it reads the test vector from the test vec...

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Abstract

The invention discloses a field programmable gate array (FPGA)-based integrated circuit testing system, and a method for testing a digital-analog hybrid integrated circuit chip provided with a digital module or using a digital module as a main module and provided with a few analog modules by using the testing system. The system mainly comprises a personal computer (PC) machine, a main control chip, a FPGA chip, configuration information storage equipment and testing vector storage equipment. The testing method is implemented by the following steps that: the main control chip configures the FPGA chip, the main control chip sends a testing command to the FPGA chip, the FPGA chip sends an excitation signal to a chip to be tested and acquires the output response of the chip to be tested, or the analog parameter module acquires analog output response, the FPGA chip compares the output response or the analog output response of the chip to be tested with the testing information and judges the consistency of the output response and the testing information, and the chip to be tested is an accepted product or a defective product is judged. The system and the method can be widely applied in the field of integrated circuit chip test.

Description

technical field [0001] The invention relates to an FPGA-based integrated circuit chip test system, and a method for testing integrated circuit chips with digital modules or digital-analog hybrid integrated circuit chips with digital modules as the main part and a small number of analog modules by using the test system . Background technique [0002] With the development of the integrated circuit industry, the proportion of the test cost of integrated circuit chips continues to rise. After the chip is designed and produced, the integrated circuit design company often needs to find a professional chip testing machine to test the chip to identify and pick out bad chips. , Only qualified chips that pass the test can be sold and used. At present, domestic integrated circuit chip testing is mainly carried out by integrated circuit design companies purchasing test machines or entrusting professional testing institutions to conduct testing. However, due to the high price of profes...

Claims

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Application Information

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IPC IPC(8): G01R31/317G01R31/3167
Inventor 杨林郑灼荣
Owner 建荣集成电路科技(珠海)有限公司
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