A micromass sensor based on a trough-shaped cantilever beam structure
A cantilever beam and micro-mass technology, applied in the field of sensors, can solve problems such as high cost, complex optical displacement measurement system, and difficult measurement
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Embodiment 1
[0038] figure 1 A structural schematic diagram of a piezoelectric micromass sensor based on a slot-shaped beam structure is given. Among them, the upper piezoelectric film 2 and the lower piezoelectric film 3 are respectively connected to the upper and lower surfaces of the channel-shaped cross-section beam 4 to form a cross-sectional symmetrical structure, and one end thereof is connected to the fixed block 1 to form a cantilever beam structure. The part including the inner surface of the groove is covered with the detector adsorption film 5 . Among them, the trough section beam 4 is made of highly elastic material, and the polarization modes of the upper piezoelectric film 2 and the lower piezoelectric film 3 are the same, and they are connected into the frequency measurement circuit system in parallel or in series, and the cantilever caused by the adsorption of the probe is measured. The beam resonance frequency change value is calculated to obtain the mass of the object t...
Embodiment 2
[0044] Figure 4 A schematic structural diagram of a piezoelectric micromass sensor based on a cantilever beam with a slot section is shown. On the basis of Embodiment 1, the lower piezoelectric film 3 is removed to form a mass sensor device consisting of an upper piezoelectric film 2 , a slot-shaped cantilever beam 4 , a fixed block 1 and a probe adsorption film 5 . During the detection process, the lower piezoelectric film 3 is connected to the frequency test system to obtain the frequency variation caused by the probe, and then obtain the micromass adsorbed by the probe adsorption film 5 . Among them, the cantilever beam part of the sensor is a double-layer combined structure of different materials, and its resonance frequency satisfies the following formula:
[0045] f 1 i = λ 1 i 2 ...
Embodiment 3
[0049] Figure 5 A structural schematic diagram of a piezoelectric micromass sensor based on a slot-shaped cross-section cantilever beam is shown. On the basis of Embodiment 1, the I-shaped cross-section channel beam 4 is replaced by a back-shaped channel-shaped beam 6. At this time, the detection object adsorption film 5 covers the outer surface and inner surface of the extension part of the cantilever beam 6, The substance to be detected is adsorbed on the outer surface and inner surface of the back-shaped groove-shaped cross-section beam 6, and the frequency measurement circuit system tests the frequency difference of the cantilever beam before and after the adsorption. In addition, in this embodiment, the measurement of microscopic mass can also be realized by using a single piezoelectric film, such as Image 6 As shown, the corresponding structure frequency change formula is calculated and measured according to the method in the second embodiment.
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