Unlock instant, AI-driven research and patent intelligence for your innovation.

Film transistor and production method thereof

A thin-film transistor and thin-film technology, which is applied in the fields of transistors, semiconductor/solid-state device manufacturing, semiconductor devices, etc., can solve problems such as operation and detection limitations, and achieve the effects of simple production, good application prospects, and low production costs.

Inactive Publication Date: 2012-05-02
NINGBO INST OF MATERIALS TECH & ENG CHINESE ACADEMY OF SCI
View PDF3 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in practical applications, sensors with planar thin-film transistor structures often suffer from many limitations in portability, operation, and detection

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Film transistor and production method thereof
  • Film transistor and production method thereof
  • Film transistor and production method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0027] This embodiment provides a thin film transistor, such as figure 1 and figure 2 As shown, the gate 1 of the thin film transistor is an aluminum wire with a columnar structure, and its cross section is circular, as shown in figure 2 As shown, but the cross-section is not limited to a circle, it can also be a shape with a symmetrical structure such as a triangle, a square, a rectangle, and a rhombus, and the length is 10 mm to 50 mm. The gate dielectric layer 2 is a hafnium oxide (HfO2) film, and the conductive channel Layer 3 is an indium zinc oxide (IZO) film, the source electrode 4 and the drain electrode 5 are respectively Ti electrodes, and the central axis of the aluminum wire of the gate 1 parallel to the length direction is the axis, and one end of the gate 1 is used as a gate contact Except for some parts, the periphery of the remaining part of the gate 1 is covered with the gate dielectric layer 2, and the periphery of the gate dielectric layer 2 is covered wi...

Embodiment 2

[0036] This embodiment provides a thin film transistor. The gate of the thin film transistor is a copper wire with a columnar structure, and its cross section is square, but the cross section is not limited to a square, and may also be circular, triangular, rectangular, rhombus, etc. The shape with a symmetrical structure, the length is 10mm to 50mm, and the gate dielectric layer is silicon dioxide (SiO 2 ) film, the conductive channel layer is an indium tin oxide (ITO) film, the source electrode and the drain electrode are Al electrodes respectively, and the central axis parallel to the length direction of the gate copper wire is the axis, and one end of the gate is used as the gate Except for the contact part, the periphery of the rest of the grid is covered with a gate dielectric layer, and the periphery of the gate dielectric layer is covered with a conductive channel layer, and the source electrode and the drain electrode are respectively arranged on the periphery of the c...

Embodiment 3

[0045] This embodiment provides a thin film transistor. The gate of the thin film transistor is a carbon fiber with a columnar structure, and its cross section is circular, but the cross section is not limited to circular, and may also be triangular, square, rectangular, rhombus, etc. The shape has a symmetrical structure, the length is 10mm to 50mm, the gate dielectric layer is an aluminum oxide (Al2O3) film, the conductive channel layer is an organic semiconductor pentacene film, the source electrode and the drain electrode are respectively Ag electrodes, and the gate The central axis of the carbon fiber parallel to the length direction is the axis, one end of the gate is used as the gate contact part, and the rest of the gate is covered with a gate dielectric layer, and the periphery of the gate dielectric layer is covered with a conductive channel layer. The source electrode and the drain electrode are respectively arranged on the periphery of the conductive channel layer. ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Lengthaaaaaaaaaa
Login to View More

Abstract

The invention discloses a film transistor and a production method thereof. A grid of the film transistor is a conductive material having a three-dimensional structure, and the conductive material is in a symmetric structure to the axis along a central axis which is parallel to the length direction of the conductive material; and one end of the conductive material is used as a grid contact part, a grid dielectric layer is coated on the periphery of the rest part of the conductive material, a conductive groove layer is coated on the periphery of the grid dielectric layer, and a source electrode and a drain electrode are respectively arranged on the periphery of the conductive groove layer. Compared with the present plane-type film transistor, the film transistor which is in a three-dimensional coating structure has the advantages of low cost, simplicity in production, convenience in carrying and flexibility in operation, can be directly used for detecting and distinguishing gases, liquid chemical substances, biological materials and the like, and has a good application prospect.

Description

technical field [0001] The invention relates to the technical field of thin film transistors, in particular to a low-cost thin film transistor with a three-dimensional covering structure and a manufacturing method thereof. Background technique [0002] With the rapid development of the information society, various high-precision electronic products continue to appear and become popular rapidly. The direction of humanization is developing, and flat-panel displays and sensors based on array units are the products of this trend. Flat-panel displays and sensors with the best performance generally require the assistance of an active matrix, and the core components of flat-panel displays and sensors with active matrices are thin-film transistors. [0003] Studies have demonstrated that the direct coupling of electronics and sensor media that provide real-time output has unique sensitivity properties to various chemicals and biological materials. Due to the compatibility of thin ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L29/423H01L29/10H01L29/786H01L21/28H01L21/336
Inventor 张洪亮万青竺立强吴国栋肖惠
Owner NINGBO INST OF MATERIALS TECH & ENG CHINESE ACADEMY OF SCI