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Manufacturing process of large-diameter silicon wafer

A manufacturing process and large-diameter technology, which is applied in the direction of manufacturing tools, metal processing equipment, and machine tools suitable for grinding workpiece planes, etc., and can solve the problems of easily polluted workshops and large area occupied by grinding equipment

Active Publication Date: 2012-07-04
GRINM SEMICONDUCTOR MATERIALS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the grinding disc print can be removed by grinding process, the grinding equipment occupies a large area and is easy to pollute the workshop

Method used

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  • Manufacturing process of large-diameter silicon wafer
  • Manufacturing process of large-diameter silicon wafer
  • Manufacturing process of large-diameter silicon wafer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0040] P(100) produced by the Czochralski method, 15 pieces of 12-inch silicon slices with a resistivity of 1-100Ωcm and a thickness of about 900 microns were ground on a double-sided grinding machine with a target removal amount of 75 microns. After double-sided grinding, the geometric parameters of the silicon wafer were measured with an AFS3220 geometric parameter tester in order to measure the global roughness (GBIR) of the silicon wafer surface. The GBIR of each chip varies as image 3 shown. It can be seen from the figure that the change of GBIR is less than 0.7 micron.

Embodiment 2

[0042] Get above 15 slices of silicon wafers through double-sided grinding, use the method of the present invention to carry out single-sided grinding on the single-sided grinding machine, the machining removal amount of single side is 10 microns, and two sides process and remove 20 microns altogether, then use The AFS3220 geometric parameter tester measures the geometric parameters of silicon wafers, see GBIR after single-side grinding Figure 4 . It can be seen from the figure that after the present invention, the GBIR is less than 0.4 micron after single-side grinding, and the precision is high.

Embodiment 3

[0044] Get the above 15 silicon wafers through single-sided grinding, corrode with an alkali etching machine, and the removal amount is 5 microns, then use the method of the present invention to carry out double-sided polishing on a Speedfam20B polishing machine, and the polishing removal amount is 25 microns. Then wash it with a washing machine and dry it with a spin dryer. See GBIR after polishing. Figure 5 . It can be seen from the figure that after the present invention, the GBIR is less than 0.45 microns, which can meet the precision requirements of large-diameter silicon wafer manufacturing.

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Abstract

The invention discloses a manufacturing process of a large-diameter silicon wafer. The process comprises the following steps of: (1) carrying out double-sided grinding on a chamfered silicon wafer by using a double-sided grinding machine, wherein the mesh number of a used grinding abrasion wheel is 2,000-3,000#, and the removal amount is 20-100 microns; (2) carrying out single-sided grinding on the silicon wafer, wherein the step of single-sided grinding refers to a process of only grinding one side, or grinding one side and then grinding the other side, the removal amount of grinding one side is 5-20 microns, the mesh number of the used grinding abrasion wheel is 5,000-8,000#; (3) carrying out alkaline corrosion on the silicon wafer, wherein the alkali is KOH, and the removal amount is 0.1-5 microns; (4) carrying out conventional double-sided polishing on a single-sided grinding sheet, wherein the removal amount is 10-30 microns; and (5) carrying out single-sided finishing polishing and cleaning on the silicon wafer. A laser inscription process is added after the double-sided grinding or single-sided grinding, and cleaning and drying processes can be added after the (1) to (5) steps. According to the silicon wafer manufactured by the process disclosed by the invention, the silicon wafer with high flatness can be obtained, meanwhile the processing efficiency of the silicon wafer can be greatly improved. The manufacturing process of the large-diameter silicon wafer is a silicon wafer manufacturing method with low damage and high precision.

Description

technical field [0001] The invention relates to a large-diameter silicon wafer manufacturing process, in particular to a method of finishing the silicon wafer with a single-sided grinding process after double-sided grinding, removing the pointed protrusions on the surface, and then polishing the silicon wafer through a polishing process. . Background technique [0002] Semiconductor silicon wafer is the main substrate material of modern ultra-large-scale integrated circuits. Generally, it is an integrated circuit-level wafer manufactured through processes such as crystal pulling, slicing, chamfering, grinding (including grinding and grinding), corrosion, polishing, and cleaning. Semiconductor wafers. Among them, the grinding process after chamfering can make the silicon wafer obtain a higher-precision shape, and the machining accuracy directly affects the geometric parameters of the product. [0003] In the process of 300mm silicon wafer processing, the processing before p...

Claims

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Application Information

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IPC IPC(8): B24B7/22B24B29/02
Inventor 库黎明闫志瑞索思卓鲁进军葛钟常青
Owner GRINM SEMICONDUCTOR MATERIALS CO LTD
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