Manufacturing process of large-diameter silicon wafer
A manufacturing process and large-diameter technology, which is applied in the direction of manufacturing tools, metal processing equipment, and machine tools suitable for grinding workpiece planes, etc., and can solve the problems of easily polluted workshops and large area occupied by grinding equipment
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Embodiment 1
[0040] P(100) produced by the Czochralski method, 15 pieces of 12-inch silicon slices with a resistivity of 1-100Ωcm and a thickness of about 900 microns were ground on a double-sided grinding machine with a target removal amount of 75 microns. After double-sided grinding, the geometric parameters of the silicon wafer were measured with an AFS3220 geometric parameter tester in order to measure the global roughness (GBIR) of the silicon wafer surface. The GBIR of each chip varies as image 3 shown. It can be seen from the figure that the change of GBIR is less than 0.7 micron.
Embodiment 2
[0042] Get above 15 slices of silicon wafers through double-sided grinding, use the method of the present invention to carry out single-sided grinding on the single-sided grinding machine, the machining removal amount of single side is 10 microns, and two sides process and remove 20 microns altogether, then use The AFS3220 geometric parameter tester measures the geometric parameters of silicon wafers, see GBIR after single-side grinding Figure 4 . It can be seen from the figure that after the present invention, the GBIR is less than 0.4 micron after single-side grinding, and the precision is high.
Embodiment 3
[0044] Get the above 15 silicon wafers through single-sided grinding, corrode with an alkali etching machine, and the removal amount is 5 microns, then use the method of the present invention to carry out double-sided polishing on a Speedfam20B polishing machine, and the polishing removal amount is 25 microns. Then wash it with a washing machine and dry it with a spin dryer. See GBIR after polishing. Figure 5 . It can be seen from the figure that after the present invention, the GBIR is less than 0.45 microns, which can meet the precision requirements of large-diameter silicon wafer manufacturing.
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