Comprehensive test system for automobile instruments

A technology for automotive instrumentation and comprehensive testing, applied in the direction of instruments, etc., can solve the problems of low signal accuracy, low versatility of equipment and testing process, unsatisfactory results, etc., and achieve the effect of simple operation

Active Publication Date: 2012-07-18
南京申华汽车电子有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It brings great inconvenience to the product test: ①The hardware wiring work is cumbersome before the test, the test process is uncontrollable, and the test times are not recorded in detail
②During the test, the signal accuracy is not high, the simulation of the process capability is not strong, and the final effect of the test is not satisfactory
③Different instruments require systematic adjustment of the hardware circuit, and the equipment and test process are not universal

Method used

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  • Comprehensive test system for automobile instruments
  • Comprehensive test system for automobile instruments
  • Comprehensive test system for automobile instruments

Examples

Experimental program
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Effect test

Embodiment 1

[0061] The specific example of this implementation is: the durability test of the 08 light truck full electronic instrument (part number: 58QN), the durability test includes: the odometer, the speedometer, the water temperature gauge, the fuel gauge, the air pressure gauge A, the air pressure gauge B, and the sky blue standard 7 small meters; carry out two states of full bright and full dark for each indicator light and light on the instrument panel, and carry out durability tests for different times respectively. The process is as follows:

[0062] ① Call out the part number code of the instrument assembly from the control system, and the system will automatically load all the test parameters of the meter into the data buffer.

[0063] ② To modify the test parameters and related parameters, please click the "Parameter Input" button to enter the parameter input subroutine interface. For example, the odometer, tachometer, water temperature gauge, fuel gauge, sky blue gauge, ai...

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Abstract

The invention relates to a comprehensive test system for automobile instruments. According to the comprehensive test system for the automobile instruments, a CPU (Central Processing Unit) master control module is used for carrying out global control on other eight modules, the outputs of the modules are controlled at all time according to control instructions from a man-machine interface display module, and various parameters of the system can be inputted, modified and stored. The comprehensive test system can randomly meet the requirements on the repeated endurance test and basic error test on various automobile instruments, such as odometers, tachometers, water temperature gauges, fuel gauges, oil pressure gauges, barometers, voltmeters, and various indication lamps and lighting lamps of instrument panels, and the operation is simple. During the process of system designing, the ergonomic factors are fully considered, and the error-proofing design is fused during the process of parameter input, so that the parameter input is rejected and the operation of alarming is carried out if the data input is incorrect.

Description

technical field [0001] The invention relates to a novel automobile meter comprehensive test system. Background technique [0002] At present, there are many kinds of automobile instrumentation, and the structure of automobile instrumentation changes rapidly. For example, the types of automotive meters are divided into mechanical structure car meters, cross structure electronic meters, stepping motor structure electronic meters, and full digital electronic meters. All kinds of instrument durability and basic error tests are custom-made special test equipment to meet the test requirements of automotive instrumentation. If there is no special test equipment for testing, it is necessary to use a regulated power supply with a signal generator, resistance box, BCM module, etc. to complete. It brings great inconvenience to the product test: ①The hardware wiring work before the test is cumbersome, the test process is uncontrollable, and the test times are not recorded in detail. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D18/00
Inventor 王猛
Owner 南京申华汽车电子有限公司
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