Unlock instant, AI-driven research and patent intelligence for your innovation.

Method for forming multiple silicon trenches on MEMS (Micro Electro Mechanical Systems) sealing-cap silicon chip and etching mask structure thereof

A technology for capping silicon wafers and etching masks, which is applied in microstructure technology, microstructure devices, and manufacturing microstructure devices, etc., can solve problems such as photoresist trapped in deep grooves and photolithography process cannot be carried out normally.

Active Publication Date: 2014-04-09
HANGZHOU SILAN INTEGRATED CIRCUIT
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the aspect ratio of the silicon groove is greater than 2 or the groove depth is greater than 3um, the previously formed deep groove will cause the subsequently formed photoresist to be trapped in the deep groove, resulting in the inability to obtain the silicon wafer by using the conventional coating process. Uniform glue thickness plane, so that the subsequent photolithography process cannot be carried out normally

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for forming multiple silicon trenches on MEMS (Micro Electro Mechanical Systems) sealing-cap silicon chip and etching mask structure thereof
  • Method for forming multiple silicon trenches on MEMS (Micro Electro Mechanical Systems) sealing-cap silicon chip and etching mask structure thereof
  • Method for forming multiple silicon trenches on MEMS (Micro Electro Mechanical Systems) sealing-cap silicon chip and etching mask structure thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0070] The present invention will be further described below in conjunction with specific embodiments and accompanying drawings, but the protection scope of the present invention should not be limited thereby.

[0071] figure 1 A schematic flow diagram showing a method for forming a multi-silicon groove of a MEMS capped silicon wafer in this embodiment, including:

[0072] Step S11, providing a MEMS capping silicon substrate;

[0073] Step S12, forming n overlapping mask layers on the MEMS capping silicon substrate, where n is a positive integer greater than or equal to 2, and after forming each mask layer, the mask layer and its Photolithography and etching are performed on all other mask layers below to form a plurality of different etching windows, wherein two adjacent mask layers have different materials;

[0074] Step S13, using the current uppermost mask layer among the n-layer mask layers as a mask to etch the MEMS capping silicon substrate, the etching will affect th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A multi-silicon trench forming method and an etching mask structure thereof for an MEMS sealing cap silicon chip. The method comprises: step S11, providing an MEMS sealing cap silicon substrate (100); step S12, forming n overlapped mask layers (101, 102, 103) on the MEMS sealing cap silicon substrate (100), and after forming each mask layer, photoetching and etching the mask layer and all the other mask layers beneath same, so as to form a plurality of different etching windows (D1, D2, D3); step S13, etching the MEMS sealing cap silicon substrate using the current uppermost mask layer and a layer of mask material beneath same as a mask; step S14, removing the current uppermost mask layer; and step S15, repeating steps S13 and S14 until all the mask layers are removed. The present invention can form a plurality of deep trenches with a high aspect ratio on an MEMS sealing cap silicon chip using a conventional semiconductor process, thereby avoiding the problem that the conventional spin coating cannot be conducted on a sealing cap silicon chip with a deep trench using a photoresist.

Description

technical field [0001] The invention relates to a method for forming multiple silicon grooves of a MEMS cap silicon chip and an etching mask structure thereof, in particular to a method for forming a plurality of silicon grooves with different groove depths on a MEMS cap silicon chip. Background technique [0002] Micro Electro Mechanical Systems (MEMS, Micro Electro Mechanical Systems) technology is known as a revolutionary high-tech in the 21st century. Its development began in the 1960s. It is an ingenious combination of microelectronics and micromechanics. It has been developed in recent years. A new type of interdisciplinary technology, which will have a revolutionary impact on human life in the future. [0003] The basic technologies of MEMS mainly include silicon anisotropic etching technology, silicon / silicon bonding technology, surface micro-mechanical technology, LIGA technology, etc. The above-mentioned technologies have become indispensable core technologies for ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): B81C1/00B81B7/00
CPCB81C1/00396B81B2203/033B81C1/00619B81B7/0077H02N1/008
Inventor 闻永祥刘琛季峰李立文
Owner HANGZHOU SILAN INTEGRATED CIRCUIT