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A molecular beam epitaxy growth method for low-density inas quantum dots

A technology of molecular beam epitaxy and growth method, which is applied in the field of molecular beam epitaxy growth, can solve the problems of low repeatability of low-density InAs quantum dot growth, achieve improved low-temperature micro-region spectrum, reduce system random errors, and achieve high repeatability Effect

Active Publication Date: 2016-04-13
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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Problems solved by technology

Therefore, for low-density InAs quantum dots grown using ex-situ calibrated critical parameters, the growth parameter errors caused by different batches of samples due to molybdenum, chamber atmosphere, growth rate test, etc. will lead to repeatable growth of low-density InAs quantum dots. Very low sex (below 50%)

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  • A molecular beam epitaxy growth method for low-density inas quantum dots
  • A molecular beam epitaxy growth method for low-density inas quantum dots
  • A molecular beam epitaxy growth method for low-density inas quantum dots

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[0021] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0022] figure 1 It shows the flow chart of the low-density InAs quantum dot molecular beam epitaxial growth method proposed by the present invention. Such as figure 1 As shown, the present invention proposes a low-density InAs quantum dot molecular beam epitaxy growth method, which mainly includes: growing InAs sacrificial layer quantum dots on a substrate; in-situ high-temperature annealing to completely desorb the InAs sacrificial layer quantum dots; fine-tuning InAs sacrificial layer quantum dots are converted from two-dimensional to three-dimensional critical growth parameters, and the InAs active layer quantum dots are grown with the fine-tuned critical growth parameters.

[0023] In a preferred embodiment of the p...

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Abstract

The invention discloses a growth method of a low-density InAs (Indium Arsenide) quantum dot. The growth method comprises the following steps of: 1: inserting an InAs sacrificial layer quanta point before an InAs active layer quanta point is grown; 2: completely desorbing the InAs sacrificial layer quanta point by annealing in situ at high temperature; and 3: fine adjusting the critical growth parameter of the InAs sacrificial layer quanta point converted from two dimensions to three dimensions, and growing the InAs active layer quanta point. According to the invention, the critical growth parameter, which is acquired in situ, of the InAs sacrificial layer quanta point converted from two dimensions to three dimensions effectively reduces the influence brought by the random error of a system, so that higher low-density repetitiveness of the InAs sacrificial layer quanta point near the critical growth parameter is achieved, and the growth success ratio of the low-density InAs sacrificial layer quanta point is effectively enhanced; the display density of an atomic force micrograph is 108 / cm<2>, and the sharp peak of a microcell photoinduced spectrum further indicates that the density of the quanta point is very low; and the low-density quanta point grown through the method is suitable for preparing a single-photon source device.

Description

technical field [0001] The invention belongs to the technical field of semiconductor materials, in particular to a molecular beam epitaxy (MBE) method for growing low-density InAs quantum dots on a GaAs substrate. Background technique [0002] The use of InAs single quantum dots to achieve single photon and entangled photon emission, solid-state quantum computing and quantum information processing, and extremely low threshold single quantum dot lasers are currently hot topics. It is an important technical approach to prepare high-quality single-photon sources by growing low-density InAs quantum dots. In the method of growing low-density self-organized InAs quantum dots by molecular beam epitaxy, the key to obtaining low-density quantum dots is to precisely control the critical transition parameters of the two-dimensional to three-dimensional structure of the quantum dots. For InAs / GaAs strained self-organized quantum dots, reflection high-energy electron diffractometer (RHE...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C30B23/02C30B29/40
Inventor 李密锋喻颖贺继方査国伟尚向军倪海桥贺振宏牛智川
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI