Read amplification circuit for nonvolatile memory and memory

A readout amplifier and circuit technology, applied in static memory, read-only memory, digital memory information, etc., can solve the problems of reading out wrong data and slowing down the data readout speed of the sense amplifier, and achieve the effect of prolonging the service life

Active Publication Date: 2013-10-30
SHANGHAI FUDAN MICROELECTRONICS GROUP
View PDF4 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, the data readout speed of the sense amplifier will be slowed down, and in the worst case, the wrong data will be read out.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Read amplification circuit for nonvolatile memory and memory
  • Read amplification circuit for nonvolatile memory and memory
  • Read amplification circuit for nonvolatile memory and memory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach

[0026] Based on this, according to an embodiment of the sense amplifier circuit of the present invention, it includes:

[0027] A basic physical unit composed of a multi-bit storage unit, each storage unit is correspondingly connected to a respective readout bit line; the basic physical unit is gated through a first gate;

[0028] The same layout as the basic physical unit, a reference cell group composed of multi-bit reference cells, wherein each reference cell is in one-to-one correspondence with each memory cell, is correspondingly connected to the respective reference voltage line, and is completely identical to the structure of the corresponding memory cell The same; the reference unit group is gated through the second gating tube; the structure of the second gating tube is exactly the same as that of the first gating tube;

[0029] The sense amplifier is connected to the plurality of readout bit lines and reference voltage lines, and outputs corresponding readout data ac...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a read amplification circuit for a nonvolatile memory and a memory. The read circuit comprises a basic physical unit composed of a plurality of storage units, a reference unit set and a read amplifier, wherein the storage units are correspondingly connected to respective read bit lines; the basic physical unit is gated via a first gate tube; the reference unit set has the same configuration as the basic physical unit and is composed of a plurality of reference units; the reference units and the storage units are one-to-one correspondence; the reference units are correspondingly connected with respective reference voltage lines, and respectively have the same structure as the corresponding storage units; the reference unit set is gated via a second gate tube; the second gate tube has the same structure as the first gate tube; the read amplifier is connected with the read bit lines and the reference voltage lines, and outputs corresponding read data according to the comparative result between the read bit lines and the voltages on the corresponding reference voltage lines. The read amplification circuit can enhance the data read speed when reading the memory, and prolong the service life of the memory.

Description

technical field [0001] The invention relates to the field of memory design, in particular to a sense amplifier circuit and memory for non-volatile memory. Background technique [0002] Non-volatile memory (NVM, Non Volatile Memory) is widely used in various electronic circuits because it can still maintain data information when the system is powered off or has no power supply. Non-volatile memory generally includes two types according to its structure type: floating gate type and charge well type. In floating-gate memory, charge is stored in floating gates, which retain the charge in the absence of a power supply. Floating gate memories generally have a gate structure in which a control gate and a floating gate are stacked. Floating gate memory is usually used in EPROM (Electrically Programmable Read Only Memory) and EEPROM (Electrically Erasable and Programmable Read Only Memory). [0003] In an EEPROM, a single-ended sense amplifier is usually used to read out data in a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G11C16/26G11C7/06
Inventor 周泉马庆容沈晔晖刘岐倪成峰俞惠芬
Owner SHANGHAI FUDAN MICROELECTRONICS GROUP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products