Digital signal processing (DSP) device single particle turning effect testing method

Abstract

The invention discloses a digital signal processing (DSP) device single particle turning effect testing method. According to the method, testing cases are designed by modules and are reduced on the premise that all the modules do not interfere with one another, the single-particle turning of all the modules in a DSP device are tested more comprehensively while the single-particle turning testing and interruption testing confusion of all the modules are reduced, so that the single-particle turning testing time is reduced, and resources are saved; a fixed vector testing method is adopted, a testing program works outside the DSP device, an internal program random-access memory (RAM), an internal data RAM and a register are set to be fixed vectors, transmission faults caused by program designing are reduced, the output of each interface penetrates through 0 and 1 alternating waveforms, and the judgment of interface faults is prevented.

Description

technical field [0001] The invention relates to a single-event flipping effect detection method, in particular to a DSP device single-event flipping effect detection method, which belongs to the technical field of space communication. Background technique [0002] DSP devices are widely used in digital communication systems because they are suitable for digital signal processing, such as Fourier transform, digital filtering algorithms, encryption algorithms, and encoding and decoding algorithms. DSP has also been successfully used many times in satellite-borne signal processing systems. . However, the space is full of various particles from the universe: protons, electrons, heavy ions, alpha particles, beta rays, etc., these particles will cause the radiation effect of the device, and the DSP device is mainly manifested as a single event effect and a total dose effect. The present invention The research is on the detection of single event upset effect of DSP devices. [00...

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Problems solved by technology

[0003] There are many foreign studies on single event flipping detection of DSP devices: Literature [1] "Radiation Hardness Evaluation of a Class V32-Bit Floating-Point Digital Signal Processor" adopts the method of adding vectors by sub-modules, and designs 24 test programs plus several 10,000 test vector detection figure 1 The single event effect of the main module of the DSP device is shown. The test case is too complicated. There are 24 test cases, and the test vectors used are as high as tens of thousands. At the same time, although the test in document [1] is relatively comprehensive, the division of each module is not accurate, and there is no Introduce how to solve the fault transfer; literature [2] "Single Event Upset Characterization of the SMJ320C6701Digital Signal Processor Using Proton Irradiation" adopts the method of sub-modules and fixed numbers, designs 5 test programs, and monitors the DSP device through the JTAG port to run the test program The single event effect of 5 modules including internal register, integer operation unit, floating point operation unit, DMA controller and internal RAM area. This test method has more test cases but fewer test modules. Only two tests are designed for the CPU module. In the test case, there is no test for the EMIF interface of the important module of the DSP device. At the same time, the detection method uses a fixed number method, and it is not easy to find when the interface fails; the test method uses JTAG to run the test case, and the operation result is not easy to monitor; literature [3 ] "Single Event Effects Test Results for the80C186and80C286Microprocessors and the SMJ320C30and SMJ320C40Digital Signal Processors" adopts the detection method of sub-modules and simple program operation, designs 4 to 5 test cases, and completes several main functional modules of 5 kinds of DSP devices, such as arithmetic unit, register, bus and CACHE unit, but the test case used in this test is a simple program, which consists of two short loop programs plus NOP statements, and it is not easy to observe when a single event flip causes an error

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