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Measurement method of key geometric characteristics of nanoparticles

A key geometric feature, nanoparticle technology, applied in the field of optical measurement, can solve the problems of slow measurement speed, inconvenient measurement and real-time measurement, high requirements, etc., to achieve the effect of improving stability and accuracy

Active Publication Date: 2015-10-21
TSINGHUA UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Microscopic imaging can obtain rich geometric information of a single nanoparticle, but cannot obtain the overall information of many particles (such as geometric scale distribution, etc.), and the measurement speed is slow, the efficiency is low, the cost is high, the equipment investment is large, and professional operation is required etc. It is not convenient for measurement outside the laboratory and real-time measurement
Dynamic light scattering method and small-angle X-ray scattering method have fast measurement speed, high efficiency, low cost, simple operation, convenient operation outside the laboratory and real-time measurement, and can obtain a large amount of statistical measurement data, but the disadvantage is that they can only measure many nanoparticles The average information of individual particles cannot detect the size and shape information of individual particles, and the reconstruction of particle morphology requires high requirements for the corresponding theoretical model and numerical algorithm of the inverse problem.

Method used

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Embodiment Construction

[0032] The method for measuring the key geometric features of metal nanoparticles provided by the present invention will be described in detail below in conjunction with the accompanying drawings. For the convenience of description, the present invention firstly introduces a spectroscopic measurement system for measuring key geometric features of metal nanoparticles.

[0033] see figure 1 , the first embodiment of the present invention provides a spectrum measurement system 100, the spectrum measurement system 100 includes a light source module 20, a chopper 6, a reference sample module 30, a reflection module 40, a sample cell 3 and a photoelectric Detection and processing unit 5. The light emitted by the light source module 20 is split by the chopper 6 to form two beams. One beam of light enters the photoelectric detection and processing unit 5 after passing through the reference sample module 30 ;

[0034] The light source module 20 is used to generate monochromatic ligh...

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Abstract

A provided method for measuring key geometrical characteristics of nanometer particles comprises the following steps: loading the nanometer particles on a sample pool to obtain an extinction spectrum of the nanometer particles; arranging a mixed solution containing the nanometer particles in a referential sample pool and the sample pool for measuring to obtain a scattered spectrum of the nanometer particles; changing the concentration and the optical path length of metal nanometer particles, repeating the above steps, exporting measured data according with a linear response zone; pre-estimating the kinds of the key geometrical characteristics contained by the nanometer particles and the geometrical scale distribution scope; establishing databases of the relationship about the key geometrical characteristics with the extinction section coefficient and with the scattering cross-section coefficient; respectively converting the databases of the relationship about the key geometrical characteristics with the extinction cross-section coefficient and with the scattering section coefficient into matrixes, and converting the inverse problem into a linear equation group; and solving according to the databases of the extinction spectrum, the scattered spectrum and the extinction cross-section coefficient and the database of the scattering cross-section coefficient, to obtain the key geometrical characteristics of the nanometer particles.

Description

technical field [0001] The invention relates to the field of optical measurement, in particular to a measurement method for measuring key geometric characteristic quantities of nanoparticles, especially metal nanoparticles, by using a scattering spectrum measurement method. Background technique [0002] Nanoparticles refer to particles with a three-dimensional geometric scale between 1nm and 100nm. Nanoparticles, especially metal nanoparticles, because of their unique physical, chemical, and optical properties, especially the unique localized surface plasmon resonance effect (LSPR), Metal nanoparticles have a wide range of important applications in the fields of catalysis, biochemical sensing, biomolecular labeling, medical imaging and auxiliary diagnosis, drug delivery and release, plasmonics, and surface-enhanced Raman spectroscopy. The key geometric features of a large number of nanoparticles mainly include shape features such as aspect ratio parameters AR, width D, and h...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N15/02
Inventor 徐宁汉白本锋谭峭峰金国藩
Owner TSINGHUA UNIV
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