Single-light-source dual-wavelength LIBS (laser-induced breakdown spectroscopy) measurement device and method

A dual-wavelength laser and spectral measurement technology, applied in the field of laser diagnosis and spectral analysis, can solve the problems of limiting the application range of LIBS technology, complex structure of the test device, high cost, etc., and achieve the effect of simple structure, improved detection sensitivity, and low cost.

Inactive Publication Date: 2014-01-22
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] The analysis shows that in the above-mentioned double-pulse LIBS technology, the realization of plasma signal enhancement requires either two lasers or one of the lasers is replaced by a high-voltage discharge device; Expensive defects that limit the scope of application of LIBS technology

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  • Single-light-source dual-wavelength LIBS (laser-induced breakdown spectroscopy) measurement device and method

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Embodiment Construction

[0027] A specific embodiment is given below in conjunction with the accompanying drawings, and the present invention is described in further detail.

[0028] Such as figure 1 As shown, the single-light source dual-wavelength laser-induced breakdown spectroscopy measurement device mainly includes a pulse laser 100, a frequency doubling crystal 110, a beam splitter 120, a total reflection mirror I131, a total reflection mirror II132, an optical shutter 140, a converging lens I151, a converging Lens II152, converging lens III153, mobile platform 210, optical fiber collection head 220, spectrometer 230, synchronization delay controller 300 and computer 400;

[0029] The pulsed laser 100 is an electro-optic Q-switched Nd:YAG laser with a pulse repetition frequency of 1-20Hz and a single pulse energy of 20-80mJ;

[0030] The laser light generated by the pulsed laser 100 passes through the frequency doubling crystal 110 and is divided into fundamental frequency light (wavelength 106...

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Abstract

The invention discloses a single-light-source dual-wavelength LIBS (laser-induced breakdown spectroscopy) measurement device and method. The device mainly comprises a pulsed laser device, a frequency multiplying crystal, a light splitter, a first total reflector, a second total reflector, a light shutter, a spectrograph and a synchronous delay controller, wherein laser generated by the pulsed laser device passes through the frequency multiplying crystal, and then is divided into fundamental frequency light and frequency multiplying light, and is irradiated to the light splitter; the frequency multiplying light is reflected by the first total reflector, and is vertically irradiated to the surface of a to-be-detected sample; the fundamental frequency light passes through the light shutter, then is reflected by the second total reflector, and then is irradiated above the surface of the to-be-detected sample by 1-5mm in parallel; spectrum signals generated by a plasma stimulated from the to-be-detected sample are converged to an optical fiber collecting head, and are transmitted to the spectrograph. The single-light-source dual-wavelength LIBS measurement device provided by the invention has the advantages of simple structure, compact volume and low price while achieving dual-pulse LIBS high detection sensitivity, and can be widely applied to the technical field of laser diagnosis and spectrum analysis.

Description

technical field [0001] The invention belongs to the technical field of laser diagnosis and spectrum analysis, and in particular relates to a single-light source and dual-wavelength laser-induced breakdown spectrum measurement device and method for material element content analysis. Background technique [0002] Laser-induced breakdown spectroscopy (LIBS) technology uses a high-power-density laser to focus on the surface of the sample to be tested to generate a high-temperature laser plasma of 10,000K to 20,000K. The determination and analysis of the wavelength of the emitted spectrum determines the composition of the elements in the sample to be tested. LIBS technology has low operating cost, fast measurement speed, high sensitivity, no or only simple sample pretreatment, and can realize multi-element synchronous rapid detection of samples. It has been tried to be applied to the field of object element composition diagnosis and other fields. [0003] Traditional LIBS techno...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/63
Inventor 李新忠汤洁王屹山赵卫段忆翔
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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