126 results about "Dual pulse" patented technology

The invention provides a double-pulse high-frequency switching power supply control method and system for precise electroplating, and relates to the field of electroplating, and the method comprises the steps: collecting area surface data through a three-dimensional scanner, and obtaining a three-dimensional model; extracting a high-curvature area grid according to the three-dimensional model, and calculating to obtain a surface concave-convex degree index; performing current field simulation, and calculating current density vector distribution; when the deviation of the current density vector distribution exceeds a preset deviation threshold value, pulse parameters are optimized through a genetic algorithm; selecting a pulse parameter which is most matched with the surface concave-convex degree index, and carrying out iterative calculation to obtain updated current density vector distribution; based on the difference between the updated current density vector distribution and the initial distribution, predicting a coating thickness value, and determining a preliminary evaluation index; and optimizing pulse parameters to obtain a final control scheme of uniform current distribution. According to the method, pulse parameters can be dynamically optimized according to the geometrical shape of the workpiece, and uniform current distribution and stable plating quality are realized.

The invention discloses an automatic double-pulse test system and method, and the system comprises an upper computer unit, a controller unit, a capacitor charging and discharging loop unit, a load inductance unit, an IGBT power unit, and an oscilloscope unit, the upper computer unit is connected with the controller unit, the controller unit is connected with the IGBT power unit, and the oscilloscope unit is connected with the capacitor charging and discharging loop unit. The control end of the controller unit is connected with the input ends of the capacitor charging and discharging loop unit and the load inductance unit, and the output ends of the load inductance unit, the capacitor charging and discharging loop unit and the oscilloscope unit are respectively connected with the IGBT power unit. The whole operation process can be realized through an upper computer. Full-automatic control and electrical isolation of the whole double-pulse test loop are realized through the controller, so that the test safety is effectively guaranteed; the turn-on and turn-off resistors driven by the IGBT can be adjusted on line, the operation is convenient, and the test efficiency is greatly improved; most IGBT double-pulse test scenes can be met, and the IGBT power module and the capacitor module can be directly and quickly connected with the system for testing.

The invention discloses a nanosecond particle velocity measurement method based on orthogonal line polarization beam splitting, and belongs to the technical field of particle image velocity measurement. The method comprises the following steps: providing two linear polarization state orthogonal double-pulse lasers, and respectively outputting S polarization pulse light beams and P polarization pulse light beams; the four pulse light beams are combined through the double-path laser beam combining mirror set and output to the sheet light mirror set, and a plane illumination jet flow field with the thickness smaller than or equal to 1 mm is formed; scattered light is separated according to a polarization state by using a polarization beam-splitting cubic prism, and particle images under S polarization and P polarization are respectively captured by two double-exposure cameras which are orthogonally arranged; five kinds of time sequence control are triggered through a multi-channel synchronous controller; processing the view field deviation of the two cameras by adopting a block polynomial alignment method; and calculating a particle velocity field based on a particle tracking velocity measurement algorithm. According to the invention, the polarization debugging error is reduced, the homogeneity error after beam combination is obviously reduced, the coincidence degree of the four beams of planar light is improved, and a high-precision universal alignment scheme is provided for the multi-camera PTV technology.

The invention provides a device consistency testing and screening method and device and electronic equipment, and the method comprises the steps: arranging IGBT modules which are connected in parallel, and enabling the IGBT modules to be internally provided with uniformly and symmetrically laminated busbars; setting the lengths of the gate pole signal wiring corresponding to each IGBT module to be consistent; selecting a target topological structure corresponding to the IGBT module, and screening a target IGBT module meeting a preset parameter index; and performing a single and double pulse test on the target IGBT module, and determining that the static current-sharing degree and the dynamic current-sharing degree corresponding to the target IGBT module are both smaller than a preset current-sharing degree threshold value. The consistency of the IGBT module can be improved through topological optimization design, multi-parameter screening and comprehensive performance testing, so that the reliability and efficiency of a converter system are improved.

The invention relates to a power device dynamic on-resistance detection method, system and equipment, a storage medium and a program product, and is applied to a power device dynamic on-resistance detection system, and the power device dynamic on-resistance detection system comprises an upper computer, a controller, a double-pulse test circuit and a signal collector, the double-pulse test circuit is provided with a tested gallium nitride power device. The method comprises the following steps: under the condition that the test temperature of a tested gallium nitride power device meets a preset test condition, sending multiple groups of double-pulse test signals to a double-pulse test circuit through a controller; collecting multiple groups of electrical test parameters of the tested gallium nitride power device under the multiple groups of double-pulse test signals through a signal collector; and detecting the on-resistance of the tested gallium nitride power device through the upper computer based on the plurality of groups of electrical test parameters. By adopting the method, the detection accuracy of the dynamic on-resistance detection of the power device is improved.

The invention relates to a driving chip in an analog integrated circuit, in particular to a high-speed high-side gate driving circuit capable of resisting high-voltage instantaneous noise interference, which comprises a double-pulse generation circuit, a low-voltage pulse signal SET and a low-voltage pulse signal RESET, the high-voltage level shift circuit is used for converting the low-voltage narrow pulse signal SET and the low-voltage narrow pulse signal RESET into a high-voltage narrow pulse signal VDS and a high-voltage narrow pulse signal VDR; the instantaneous noise digital filter circuit is used for carrying out noise filtering on the high-voltage narrow pulse signal VDS and the high-voltage narrow pulse signal VDR; the RS trigger is used for receiving the high-voltage narrow pulse signal VDS and the high-voltage narrow pulse signal VDR which are subjected to noise filtering processing and sending a trigger signal to the output-stage driving circuit; the output-stage driving circuit is used for outputting a driving signal HO to drive the grid electrode of the high-side power tube; according to the invention, the signal transmission delay time is reduced, and the instantaneous noise resistance is improved.

The invention provides a power device pin parasitic inductance measuring circuit and electronic equipment. The measuring circuit is characterized in that a measured power device is connected between the output end of a double-pulse circuit and the ground; the measuring circuit comprises a double-pulse circuit, and the double-pulse circuit is used for outputting a changing current signal to the measured power device under the driving of the first pulse signal and the second pulse signal. According to the measuring circuit, the power device measuring assembly is connected between the lower tube of the double-pulse circuit and the negative electrode of the direct-current power supply, so that the parasitic inductance of the pin of the measured power device can be accurately measured.

The invention relates to the field of underwater sound control, in particular to a differential spread spectrum underwater sound remote control method resistant to channel interference and Doppler. The invention provides a differential spread spectrum signal processing method based on an underwater sound remote control system, and provides a set of multipath interference resisting method combining peak searching and deconvolution aiming at a multipath effect. Aiming at the influence of noise and Doppler, a differential spread spectrum signal in a code element difference mode is used as a response signal of the UUV, a double-pulse method is firstly used for Doppler coarse compensation during resolving, and then an orthogonal receiver is used for orthogonal demodulation to obtain two paths of signals; finally, coefficients containing residual Doppler and sampling errors can be offset as much as possible in a differential solution link in a differential conjugate multiplication mode. A simulation result shows that compared with a traditional method, the anti-noise and anti-multipath capability is high, and when the relative movement speed between the UUV and the water surface mother ship is small, the bit error rate is lower.

The invention discloses a method and system for testing electromagnetic radiation characteristics of an IGBT module for a converter valve, and the method comprises the steps: selecting an inductive load connection mode according to the position of an IGBT to be tested during testing: testing an upper IGBT, and connecting the two ends of an inductive load with a first wiring terminal and a second wiring terminal (the first wiring terminal is a neutral point between the upper IGBT and a lower IGBT) of the converter valve; and when the lower tube IGBT is tested, the first wiring terminal and the positive terminal of the bus capacitor are connected. A combined electromagnetic field probe is arranged around the IGBT to be detected, a probe shell is grounded, and a lead is connected with a signal conversion device. Firstly, a bus capacitor is charged to a stable voltage, and environmental background noise is collected by a probe when no gate pole is triggered. And pulse parameters are set by the upper computer and are sent to the driving board through the optical fiber to trigger the IGBT double-pulse action. Electric signals output by the probe are converted into optical signals through the photoelectric converter and transmitted to external equipment through the optical fiber to be restored. And subtracting background noise from a double-pulse measurement result, extracting a net radiation electromagnetic signal, and separating electromagnetic interference signals in different processes according to the switching time of the IGBT. The invention aims to accurately measure the radiation electromagnetic interference signal of the IGBT in the converter valve module in the switching-on, switching-off and diode follow current processes, and provides a basis for the electromagnetic compatibility design and shielding reinforcement of the converter valve module.

The invention discloses a double-end photoelectric synapse element based on two-dimensional intrinsic ferroelectricity and TMDs Van der Waals heterojunction as well as a preparation method and application of the double-end photoelectric synapse element, and belongs to the technical field of photoelectric synapses. The element comprises a substrate layer, a channel layer and a packaging layer which are stacked in sequence, the channel layer is formed by stacking a single layer of two-dimensional TMDs and a two-dimensional intrinsic ferroelectric alpha-indium selenide layer; a source electrode is deposited on the TMDs, and a drain electrode is deposited on the alpha-indium selenide layer. The preparation method of the element comprises the following steps: cleaning the substrate layer, growing the single-layer two-dimensional TMDs through a CVD (chemical vapor deposition) method, and stacking the two-dimensional intrinsic ferroelectric alpha-indium selenide layer on the single-layer two-dimensional TMDs to obtain a precursor; the precursor is sequentially subjected to primary annealing, etching and electrode evaporation, and then is subjected to secondary annealing, so that the electrode is obtained. The element adopts photoelectric signal hybrid regulation and control, is used for preparing an artificial brain-like synapse device, and can effectively solve the problems of high power consumption and low dipulse dissimilation index in the prior art.

The invention discloses a double-pulse test protection circuit, relates to the field of power electronics, and is characterized in that a third switch, a current detection device and a control module are additionally arranged on the basis of an original double-pulse test circuit, and the purpose of the scheme is to collect the current value of a loop where an inductor is located through the current detection device; when the current value of the loop where the inductor is located is larger than a preset current threshold value (the current value of the loop is too high), the first switch is automatically switched off through the control module, and then the whole double-pulse test protection circuit is switched off. The current value in the double-pulse test protection circuit is not increased any more, and the reliability and safety of the scheme are ensured.

The invention discloses a power semiconductor device dipulse test system and method integrated with a temperature control module, the test system is small in size and portable, is integrated with a temperature control heater, can measure the dynamic parameters of a power semiconductor device from room temperature to the maximum junction temperature of a chip, and can determine the temperature of the power semiconductor device through the comparison of the dynamic parameters in the temperature range. The method can guide an engineer to perform reasonable device model selection, helps the engineer to deeply understand the influence of the temperature on the device performance, can optimize the system design, improves the reliability and efficiency of the device in practical application, and meets the industrial standard requirements at the same time. Moreover, the test method is simple, the potential of the power semiconductor device can be known to the greatest extent through the tests, and the stable operation of the power semiconductor device under various environmental conditions is ensured.

The present application provides a double-pulse test method, circuit and system. The double-pulse test method controls the inductance of the load inductor connected to the module to be tested to be less than the first threshold value during the first pulse of controlling the conduction of the switch tube to be tested. That is, even if the module to be tested adopts a load inductor with a smaller inductance during the first pulse, the energy transmitted from the DC bus capacitor to the load inductor can be reduced, and the degree of bus voltage drop of the high-power module when performing double-pulse testing can be reduced; no external capacitor pool is required, thereby avoiding the problem of low accuracy of test results caused by the external capacitor pool in the prior art. In addition, after the end of the first pulse, the present application can adopt a load inductor with a larger inductance. Therefore, during the double-pulse interval, the energy consumption of the load inductor is slow, and the current difference between the load inductor at the beginning of the second pulse and the end of the first pulse is small, thereby ensuring the accuracy of the test results.

The invention discloses a multi-modal AI material quantitative and qualitative rapid detection method, which comprises the following steps: acquiring multi-modal data through a double-pulse laser excitation system, carrying out time-space alignment, and cooperatively exciting light and heavy element characteristic plasmas by using femtosecond laser and nanosecond laser; spectral decoupling and dynamic compensation are carried out based on physical rule embedding, spectral signals are separated, and interference is suppressed; a light-heavy element dual-channel deep learning model is constructed, and multi-modal data is fused, so that feature extraction and prediction capabilities are improved; and a double-source mutual verification optimization model is adopted, so that the result reliability is ensured. According to the method, the limitation of single-mode detection is overcome, multi-component high-precision real-time synchronous detection of coal is realized, the adaptability of the model to complex coal quality and environmental change is improved, and an effective and accurate solution is provided for online monitoring of coal quality of a coal-fired power plant.

This invention discloses a method for enhancing and controlling the radiation of an LPP-EUV light source based on dual-pulse spatiotemporal co-constraint, belonging to the field of semiconductor manufacturing technology. This invention obtains a spatiotemporal reference by real-time monitoring of a liquid metal droplet, uses a pre-pulse laser to induce target material deformation into a fogged target cloud, and combines high-speed imaging and a hydrodynamic model to predict the time and coordinates of the target cloud's energy absorption peak. It dynamically adjusts the delay time and optical axis direction of the main pulse laser to achieve dual-pulse spatiotemporal co-constraint, and constructs a closed-loop control system through a recursive least squares algorithm with a dynamic forgetting factor. This invention effectively improves the extreme ultraviolet light conversion efficiency, controls the power fluctuation of the light source within ±0.5%, and extends the maintenance cycle of optical components by 2 times. It can be widely applied to next-generation high-power extreme ultraviolet lithography light source systems, meeting the application requirements of semiconductor miniaturization processes.

The present invention discloses a dual-pulse test system, which is configured to include: a load inductor, a test power supply is connected to a power device under test through the load inductor; a first freewheeling device, after the power device under test is tested, it forms a freewheeling loop with the load inductor; a pulse generator, which is used to provide the dual pulses required for testing the power device under test; and a failure protection circuit, when the power device under test is in a failure state, it cuts off the test power supply and constructs a freewheeling loop to make the loop current no longer increase. The present invention is configured with a failure protection circuit, which can timely cut off the power supply when the power device under test is in a failure state, and can form a freewheeling loop to realize that the loop current no longer increases, preventing the device from being burned out due to the failure of the power device under test, and playing a protective role.

The invention discloses an optical thin film sputtering deposition method and device based on double pulse sources, and belongs to the technical field of optical thin film manufacturing in optical manufacturing. According to the method, corresponding deposition parameters are adjusted according to different substrates and target materials, and deposition preparation of various optical thin films is achieved; the double-pulse source is divided into a main source and an auxiliary source, high-energy charge energy particles generated by the main pulse source bombard the surface of a target material, cascade collision occurs in several atomic layers on the surface of the target material, energy exchange occurs between the particles and the target material, and after target material atoms obtain enough energy to overcome own atomic potential barriers, the target material atoms leave the surface of the target material and are deposited on the surface of a substrate to form a thin film; the high-energy particles generated by the auxiliary pulse source bombard the surface of the growing thin film, and the film material molecules and the high-energy particles generate energy and momentum transfer to obtain large kinetic energy, so that the adhesiveness of the thin film is enhanced, and the surface arrangement is more compact. The preparation of multiple optical films can be realized, and meanwhile, the filling density and the use performance of the optical film can be improved.

The invention relates to a double-pulse test method and a test circuit. The method comprises the following steps: providing a double-pulse test circuit; the double-pulse test circuit comprises an energy charging circuit and a resonance circuit, the resonance circuit is a half-bridge LC resonance circuit or a full-bridge LC resonance circuit, and the energy charging circuit comprises a power supply and a bus capacitor; the bus capacitor is charged through the power supply; in response to charging the bus capacitor to the target voltage, disconnecting the power supply from the bus capacitor and the resonant circuit; and applying a control voltage to the control ends of the upper bridge and the lower bridge in the resonant circuit, obtaining a gate-source voltage, a drain-source voltage and a drain-source current of each switching tube in the resonant circuit under the control voltage, and obtaining a test result according to the gate-source voltage, the drain-source voltage and the drain-source current. According to the invention, the characteristics of the MOS tube in the LLC converter during actual work can be analyzed. Based on the test result obtained by the method, an important reference basis can be provided for model selection of the primary MOS transistor of the LLC converter, and poor products caused by design errors and improper model selection are avoided.

The present application relates to the field of integrated circuit technology, and provides a pulse trigger type level shift circuit, which comprises a double pulse current generating circuit, a high-low level shift conversion holding circuit, a high voltage domain output shaping filter circuit and an RS flip-flop connected in sequence. The double pulse current generating circuit generates a short double pulse current signal in response to a jump edge of a low voltage domain input signal; the high-low level shift conversion holding circuit combines the current signal with the input signal to generate a complementary pulse voltage signal in a high voltage domain; the shaping filter circuit shapes and filters the pulse voltage; and the RS flip-flop finally latches the logic state and outputs a stable high voltage domain signal without glitches. The present application generates an extremely short pulse only when the signal jumps by means of pulse current trigger, eliminates the static current path, and has low static power consumption. Meanwhile, the pulse driving is used to realize fast level inversion under high voltage difference, and the input signal driving capability requirement is low, so that the high speed and low power consumption characteristics are taken into account.

This application discloses a double-pulse testing device and method for power semiconductors, belonging to the field of power semiconductor technology. The device includes: a global control module, used to generate a parameter package based on the test task and characteristic parameters of the target device when a double-pulse test is to be performed on a target device, send the parameter package to a target local execution module, and iteratively adjust the parameter package based on the double-pulse test results of the target device fed back by the target local execution module, while simultaneously sending the iteratively adjusted parameter package to the target local execution module until the double-pulse test results of the target device fed back by the target local execution module meet the test objective; and a target local execution module, used to perform double-pulse testing on the target device according to the parameter package issued by the global control module, and to feed back the double-pulse test results of the target device to the global control module. This device can improve the efficiency and accuracy of double-pulse testing of power semiconductors.

This invention discloses a design method for parallel current sharing of BOOST multiphase interleaved silicon carbide single transistors. It identifies key parasitic parameters by building a dual-pulse simulation platform, completes device layout in conjunction with the overall system structure, uses PCB symmetry and copper layer stacking to control parasitic parameter consistency, and forms a design closed loop through dual-pulse and steady-state thermal testing. This effectively solves the problem of poor current sharing in parallel silicon carbide single transistors. Furthermore, this method ensures balanced current distribution during switching transients and conduction steady states, eliminates current sharing failures caused by parasitic parameter mismatch, fully utilizes the performance of silicon carbide single transistors without requiring amplification device margins, flexibly adapts to the overall system layout, improves space utilization, optimizes system efficiency, reduces design costs and redundancy, and achieves a reliable, efficient, and highly adaptable design for parallel current sharing of BOOST multiphase interleaved silicon carbide single transistors.

The invention relates to a method for simulating a time-saving orbit change task for "one-to-many" approach of space targets. A service aircraft adopts a double-pulse orbit change strategy to sequentially approach each target satellite, and determines an objective function for the time-saving orbit change; an optimization level is set, wherein, in the first level, a total orbit change time optimization variable is set; in the second level, an approach sequence optimization variable is set, and an approach sequence of the service aircraft arriving at the target satellite is determined by the variable size; in the third and fourth levels, within the total time limit range for the service aircraft to complete the approach of all target satellites, a value range of an approach orbit change end time optimization variable for each target satellite that satisfies both a measurement and control window and an illumination window is determined; and a value range of an approach orbit change start time optimization variable for each target satellite is determined; in the fifth level, under a given approach sequence, given approach orbit change end time and approach orbit change start time are optimized according to the objective function to obtain an optimization result; and in accordance with the set optimization level order, optimization is started by level, and the optimal result is selected from the optimization results to obtain the time-saving orbit change strategy.

The utility model discloses a negative logic IPM dipulse test circuit, which comprises a first power supply, a signal generator, a first driving IC, an inductor, a second power supply, a capacitor and an IPM, and is characterized in that the positive electrode of the first power supply is connected with the first driving IC, and the negative electrode of the first power supply is connected with the first driving IC and the signal generator; two ends of the signal generator are connected with the first driving IC, the first driving IC is connected with the IPM, and the IPM is connected with the second power supply, the inductor and the capacitor. According to the test circuit provided by the utility model, IPM double-pulse test is realized only by relying on the double-pulse signal of the signal generator, an inverter does not need to be purchased, the required power supply is less, the difficulty and the cost are reduced, and the test circuit is simpler.

The invention discloses a double-pulse gold-silver alloy electroplating system which comprises an annular EIS sensor module, a double-channel out-phase pulse power supply module, a fuzzy PID dynamic control module and a micro-injection compensation module. The annular EIS sensor module is annularly distributed along the inner wall of the electroplating bath, comprises an impedance spectrum detection electrode and an ion selection membrane, and is used for monitoring the concentration of Au2 + / Ag + in real time and detecting the impedance gradient of a deposited layer. The dual-channel out-phase pulse power supply module comprises six groups of independent temperature control pulse anode groups, and each group is connected with a dual-channel power supply comprising an Au channel and an Ag channel. The fuzzy PID dynamic control module receives the concentration deviation value and the impedance gradient data, and pulse power supply parameters are adjusted through a multivariable coupling algorithm. The micro-injection compensation module is arranged on the side wall of the tank body and comprises eight groups of micro-injection pumps, and liquid supplementing is triggered when the consumption difference value of the metal salt exceeds 5%. Accurate control over the gold-silver alloy electroplating process is achieved, and the quality and consistency of a plating layer are improved.

The invention discloses a power module stray inductance test method and test platform, and relates to the field of power module stray inductance test, the method comprises the following steps: 1, constructing a test circuit, connecting a power module to be tested and a test accompanying power module in series, and then connecting the power module to be tested and the test accompanying power module in parallel with a bus capacitor; step 2, configuring a test state, configuring an upper tube and a lower tube of the to-be-tested power module to be in a conducting state, configuring an upper tube of the accompanying test power module to be in a turn-off state, and applying a double-pulse signal to a control electrode of the lower tube of the accompanying test power module; 3, collecting test data, and collecting voltage Vds at two ends of the power module to be tested and the change rate of current flowing through the power module to be tested when the double-pulse signal controls the lower tube of the test accompanying power module to perform secondary conduction; 4, calculating a single-time stray feeling calculation value; and step 5, repeating the steps 2-4 for N times, and taking an average value of N single stray inductance calculation values obtained by N times of calculation as a power module stray inductance value obtained by measurement. The method improves the convenience and accuracy of the stray inductance test of the power module.

The purpose of the present invention is to improve the control accuracy of the opening / closing speed of an opening / closing body for opening / closing an opening in a vehicle body. An opening / closing body control device (10) is provided with: a rotation sensor (12) that outputs a first pulse signal and a second pulse signal having a phase difference (delta) from the first pulse signal; an edge detection unit (24) that detects a pulse edge of the pulse signal; a speed update unit (25) that measures and updates the opening / closing speed on the basis of the pulse signal at a predetermined update timing; and a motor control unit (26) that controls the motor (11) on the basis of the updated opening / closing speed. A speed update unit (25) executes a double-pulse update process in which the timing at which at least one of a first rising edge (E1u) and a first falling edge (E1d) is detected and the timing at which at least one of a second rising edge (E2u) and a second falling edge (E2d) is detected are set as update timings.

1. Name of this design product: Graphical user interface for double pulse testing of electronic equipment. 2. Purpose of this design product: for use in an electronic device. 3. The key design point of this design product lies in the graphical user interface. 4. The picture or photo that best illustrates the key points of the design: main view. 5. Other views are the conventional design of the product and are omitted. 6. Purpose of the graphical user interface: The main view is the main interface of the dual pulse test platform; click "Manual Test" in the upper middle part of the main view to enter the interface change status diagram 1; click "Automatic Test and Report" in the upper right part of the interface change status diagram 1 to enter the interface change status diagram 2.

The embodiment of the invention discloses a distributed optical fiber sound sensing system and device and a sound detection method, and the system comprises a laser source assembly which is used for generating continuous initial laser; the input end of the coupler is connected with the output end of the laser source assembly, and the coupler is used for dividing the initial laser into a first laser beam and a second laser beam; the input end of the acousto-optic modulator is connected with one output end of the coupler, the output end of the acousto-optic modulator is connected with the first input end of the interferometer or the input end of the erbium-doped amplifier, and the acousto-optic modulator is used for modulating the first laser beam into monopulse laser; and the interferometer is used for modulating the single-pulse laser into double-pulse laser and carrying out sound detection, and is also used for carrying out interference on the second laser beam to generate a reverse laser beam so as to carry out frequency adjustment on the laser source assembly. And the signal-to-noise ratio and the detection precision of the sensing system are improved.

The invention relates to a double-pulse modulation long-distance distributed optical fiber temperature sensing system which comprises a laser, laser output by the laser is transmitted to a grating and a first-stage laser modulator through a beam splitter, laser output by the first-stage laser modulator is transmitted to one port of a circulator through a first laser amplifier, and laser output by the second-stage laser modulator is transmitted to the other port of the circulator through a second laser amplifier. A lower port of the circulator is connected with the sensing optical fiber, a second lower port of the circulator is connected with the input end of the second laser amplifier, the grating and the output end of the second laser amplifier are connected with the signal processing module, and a second-level laser modulator is further arranged between the first-level laser modulator and the first laser amplifier. The laser pulse width output by the first-stage laser modulator is larger than that output by the second-stage laser modulator, and the first-stage laser modulator has laser intensity gain of at least one decibel. The dipulse modulation long-distance distributed optical fiber temperature sensing system provided by the invention has a relatively long detection distance under the condition that the resolution ratio is not reduced.

The utility model provides a telemetering imaging type collinear double-pulse integrated installation and adjustment device, which belongs to the technical field of telemetering imaging and comprises a telemetering imaging device body, a telemetering imaging module, a telemetering imaging module and a telemetering imaging module. The observation mechanism is arranged on the telemetering imaging equipment body and used for facilitating people to observe the operation condition of working elements in the telemetering imaging equipment body from the outside, specifically, the observation mechanism comprises a through groove and an observation window, the through groove is formed in the top of the telemetering imaging equipment body, and the observation window is fixed to the inner wall of the through groove; the telemetering imaging device is characterized in that the telemetering imaging device further comprises a docking mechanism which is arranged on the telemetering imaging device body and used for assisting in positioning. The utility model solves the problems that if the device is used for a long time, internal working elements are aged, the device is very inconvenient to replace or overhaul when needing to be replaced or overhauled, the whole shell needs to be disassembled, the labor intensity of workers is relatively high, and the working efficiency is relatively low.