Single image rapid phase displacement system and phase detection method based on deflection angles

A single image, deflection angle technology, applied in measurement devices, measurement optics, optical radiation measurement, etc., can solve the problem that speckle cannot achieve rapid deformation measurement.

Inactive Publication Date: 2014-04-09
HEFEI UNIV OF TECH
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Problems solved by technology

[0014] The technical problem to be solved by the present invention is to avoid the deficiencies in the above-mentioned prior art, provide a single image fast phase shift system and phase detection method based on the deflection angle, and adjust the large speckle generated by laser interference, so that It covers many pixels of the CCD array in the spatial domain. Thro

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  • Single image rapid phase displacement system and phase detection method based on deflection angles
  • Single image rapid phase displacement system and phase detection method based on deflection angles
  • Single image rapid phase displacement system and phase detection method based on deflection angles

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Embodiment Construction

[0041] see figure 1 , the system composition of the single image fast phase shift system based on the deflection angle in this embodiment includes a laser 1, a variable nd filter 2, a beam expander 3, a collimator assembly 4, an aperture stop 5, an imaging lens 6, Mirror 8, beam splitting prism 10 and CCD camera 9.

[0042] In this embodiment, the output light of the laser 1 is divided into object light and reference light by the variable nd filter 2. After the object light is expanded by the beam expander 3, it irradiates the surface of the object 7 to form laser speckle interference, which is The return object light on the surface of the measured object is projected on the target surface array of the CCD camera 9 through the aperture stop 5 and the imaging lens 6 in turn; The collimated laser light is irradiated on the target surface array of the CCD camera 9 through the reflector 8 and the dichroic prism 10, and forms a laser interference phenomenon with the return object...

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Abstract

The invention discloses a single image rapid phase displacement system and method based on deflection angles. The system and method are characterized in that object light emitted by a laser device irradiates an object surface to be detected to form laser speckle interference, and return object light from the object surface to be detected irradiates a target surface array of a CCD camera; reference light emitted by the laser device irradiates the target surface array of the CCD camera at an angle alpha through a collimation component and a reflector, and generates a laser interference phenomenon on the target surface array of the CCD camera together with return object light, the angle alpha is adjusted, a 120-degree optical path difference exists between reference light of two adjacent pixel points, and the phase value of the laser interference phenomenon is calculated according to the numerical values of three adjacent pixel points in information recorded by the CCD camera. By means of the single image rapid phase displacement system and method, only a single image is used in speckle interference so that rapid phase detection can be achieved, and a PZT displacement micro-movement system required by the time phase displacement method does not need to be used.

Description

technical field [0001] The invention relates to a speckle interferometry system and a phase detection method, especially an optical fast phase shift method, which can be widely used in strain and deformation measurement in machinery manufacturing, aerospace, materials and biology, etc., and can realize fast displacement Field, deformation field, vibration field detection, and non-destructive non-contact measurement of materials, frames and components. Background technique [0002] Digital Speckle Pattern Interferometry (Digital Speckle Pattern Interferometry, DSPI) is an optical measurement method that integrates laser, electronics and image processing technologies, and has the advantages of high precision, non-contact and full-field measurement. Therefore, it is widely used in the measurement of various aspects such as mechanical manufacturing, aerospace, materials and biology. [0003] Figure 4 It is an existing speckle interferometry system based on time phase shift. Th...

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Application Information

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IPC IPC(8): G01B11/16G01J9/02
Inventor 王永红孙建飞杨连祥
Owner HEFEI UNIV OF TECH
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