Single image rapid phase displacement system and phase detection method based on deflection angles

Abstract

The invention discloses a single image rapid phase displacement system and method based on deflection angles. The system and method are characterized in that object light emitted by a laser device irradiates an object surface to be detected to form laser speckle interference, and return object light from the object surface to be detected irradiates a target surface array of a CCD camera; reference light emitted by the laser device irradiates the target surface array of the CCD camera at an angle alpha through a collimation component and a reflector, and generates a laser interference phenomenon on the target surface array of the CCD camera together with return object light, the angle alpha is adjusted, a 120-degree optical path difference exists between reference light of two adjacent pixel points, and the phase value of the laser interference phenomenon is calculated according to the numerical values of three adjacent pixel points in information recorded by the CCD camera. By means of the single image rapid phase displacement system and method, only a single image is used in speckle interference so that rapid phase detection can be achieved, and a PZT displacement micro-movement system required by the time phase displacement method does not need to be used.

Description

technical field [0001] The invention relates to a speckle interferometry system and a phase detection method, especially an optical fast phase shift method, which can be widely used in strain and deformation measurement in machinery manufacturing, aerospace, materials and biology, etc., and can realize fast displacement Field, deformation field, vibration field detection, and non-destructive non-contact measurement of materials, frames and components. Background technique [0002] Digital Speckle Pattern Interferometry (Digital Speckle Pattern Interferometry, DSPI) is an optical measurement method that integrates laser, electronics and image processing technologies, and has the advantages of high precision, non-contact and full-field measurement. Therefore, it is widely used in the measurement of various aspects such as mechanical manufacturing, aerospace, materials and biology. [0003] Figure 4 It is an existing speckle interferometry system based on time phase shift. Th...

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Problems solved by technology

[0014] The technical problem to be solved by the present invention is to avoid the deficiencies in the above-mentioned prior art, provide a single image fast phase shift system and phase detection method based on the deflection angle, and adjust the large speckle generated by laser interference, so that It covers many pixels of the CCD array in the spatial domain. Through the phase calculation of a single pixel and its adjacent pixels, it only needs to collect a single image to obtain the phase map of the light field interference, in order to obtain the phase of the speckle under dynamic and fast measurement. information, effectively solving the problem that traditional speckle measurement cannot achieve rapid deformation measurement

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