Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device and method for measuring Young modulus by means of linear frequency modulation multi-beam laser heterodynes second harmonics

A linear frequency modulation and laser heterodyne technology, applied in the optical field, can solve the problems of large errors and low measurement accuracy, and achieve the effects of low power consumption, large measurement range, and obvious experimental phenomena

Inactive Publication Date: 2014-07-30
HEILONGJIANG UNIV
View PDF1 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to solve the problems of large errors and low measurement accuracy in existing methods for measuring Young's modulus, and to provide a device and method for measuring Young's modulus with linear frequency modulation multi-beam laser heterodyne second harmonic

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for measuring Young modulus by means of linear frequency modulation multi-beam laser heterodynes second harmonics
  • Device and method for measuring Young modulus by means of linear frequency modulation multi-beam laser heterodynes second harmonics
  • Device and method for measuring Young modulus by means of linear frequency modulation multi-beam laser heterodynes second harmonics

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0026] Specific implementation mode one: the following combination figure 1 Describe the present embodiment, the device and the method for measuring Young's modulus by chirp multi-beam laser heterodyne second harmonic wave described in this embodiment, it comprises chirp laser 1, thin glass plate 3, the first flat mirror 4, Metal wire 5 to be tested, weight 6, converging lens 7, photodetector 8 and signal processing system;

[0027] The non-reflecting surface of the first plane mirror 4 is attached to the bottom of the weight 6, and the center of the first plane mirror 4 is coaxial with the center of the weight 6;

[0028] One end of the metal wire 5 to be tested is fixed, and the other end of the metal wire 5 to be tested is fixedly connected to the top of the weight 5;

[0029] The thin glass plate 3 is parallel to the first plane reflector 4; the thin glass plate 3 is located below the first plane reflector 4, and the distance d between the thin glass plate 3 and the first...

specific Embodiment approach 2

[0031] Specific embodiment two: this embodiment is a further description of the device for measuring Young's modulus by the chirped multi-beam laser heterodyne second harmonic wave described in specific embodiment one, which also includes a second plane mirror 2; The linearly polarized light emitted by the frequency-modulated laser 1 is reflected by the second plane mirror 2, and then at an incident angle θ 0 Oblique incidence on a thin glass plate 3.

specific Embodiment approach 3

[0032] Specific embodiment three: This embodiment further explains the device for measuring Young's modulus by the linear frequency modulation multi-beam laser heterodyne second harmonic described in embodiment one or two, it also includes a temperature controller 7 and a temperature acquisition device , the signal processing system includes a filter 9, a preamplifier 10, an A / D conversion circuit 11 and a DSP microprocessor 12;

[0033] The input end of filter 9 is connected with the electric signal output end of photodetector 8; The output end of filter 9 is connected with the input end of preamplifier 10; The output end of preamplifier 10 is connected with the analog of A / D conversion circuit 11 The signal input terminal is connected; the digital signal output terminal of the A / D conversion circuit 11 is connected with the input terminal of the DSP microprocessor 12 .

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
lengthaaaaaaaaaa
diameteraaaaaaaaaa
wavelengthaaaaaaaaaa
Login to View More

Abstract

The invention discloses a device and a method for measuring a Young modulus by means of linear frequency modulation multi-beam laser heterodynes second harmonics, belongs to the field of optics and aims to solve the problems of large error and poor measuring accuracy in the conventional method for measuring the Young modulus. Linear polarized light emitted by a linear frequency modulation laser obliquely enters a thin glass plate at an incident angle theta0; a light beam transmitted by the thin glass plate enters a first plane mirror, and is reflected and transmitted repeatedly between the thin glass plate and the first plane mirror which are parallel to each other to obtain multiple beams of light; the light beams repeatedly reflected and transmitted between the thin glass plate and the first plane mirror are converged onto the light-sensitive surface of a photoelectric detector together with reflected light on the front surface of the thin glass plate through a converging lens; the photoelectric detector outputs an electric signal to a signal processing system; the signal processing system is used for processing data in order to obtain the distances between the thin glass plate and the first plane mirror before and after the length change of a metal wire. The device and the method are suitable for measuring the Young modulus.

Description

technical field [0001] The present invention relates to the field of optics. Background technique [0002] Young's modulus of elasticity reflects the relationship between material deformation and internal stress. When a material is subjected to external force, it must be deformed. The ratio of its internal stress and strain (ie relative deformation) is called Young's modulus of elasticity. An important physical quantity of material properties is an important parameter in the selection of mechanical components in engineering technology. In recent years, in engineering measurement technology, optical rod method, optical fiber sensor method, CCD method, interference method, stretching method and diffraction method are mostly used, but these methods have more indirect measurements, larger accidental errors, and require A large amount of data processing is carried out. Therefore, the measurement accuracy of these methods is low and cannot meet the current high-precision measurem...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/08G01B11/16
Inventor 李彦超周巍刘明亮杨九如冉玲苓高扬杨瑞海杜军丁群王春晖马立峰于伟波
Owner HEILONGJIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com