Single event upset fault processing method based on AT697 processor

Abstract

The invention provides a single event upset fault processing method based on an AT697 processor. The method comprises a step 101) of defining the format of variables of the AT697 processor, a step 102) initializing the data of an Error Detection And Correction (EDAC) functional module and a Random Access Memory (RAM)space of the AT697 processor, a step 103) detecting and modifying errors, caused by single vent upset, of an RAM or Electrically Erasable Programmable Read-Only Memory (EEPROM) connected with the EDAC module, and a step 104) of establishing a maintenance strategy and carrying out initiatively periodic traversal access to the storage spaces of all RAMs and EEPROMs, thereby reducing and eliminating single bit errors. The single event upset fault processing method is used for providing a set of complete software processing design scheme for spatial single event faults according to the characteristic that the AT697 processor provides an EDAC detection interface. The single event upset fault processing method does not need to add an extra chip, so that the weight, volume and power consumption of equipment are not increased; the processing method is simple and efficient; the single event upset fault processing method is flexible in interfaces and high in portability, and has great significance for improving the reliability and safety of satellite development of China.

Description

technical field [0001] The invention relates to the technical field of aviation and aerospace electronics integration, and more specifically relates to a software processing design scheme for AT697 series processors of aerospace anti-radiation processors. Background technique [0002] With the continuous development of aerospace technology, high integration, high complexity, and high reliability of equipment have become an inevitable development trend of on-board equipment. Large-scale integrated circuits have been widely used in the development of aerospace equipment. However, the influence of the complex space environment on large-scale integrated circuits is becoming more and more serious, especially the space single event upset (SEU) phenomenon, which has become one of the most common failures of spaceborne equipment. The phenomenon of spatial single event flipping refers to the fact that a single high-energy particle in the universe is injected into the sensitive area o...

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Problems solved by technology

However, no specific processing strategies and implementation functions are provided, which need to be completed by designers in actual use

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