Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

LED epitaxial layer growth method for improving luminous efficiency and LED epitaxial layer

A growth method and luminous efficiency technology, applied in electrical components, circuits, semiconductor devices, etc., can solve the problems of MQW layer damage, carrier leakage, etc., achieve the effects of improving luminous efficiency, improving injection efficiency, and reducing Droop effect

Active Publication Date: 2014-08-27
XIANGNENG HUALEI OPTOELECTRONICS
View PDF4 Cites 24 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a method for growing an LED epitaxial layer in which the P-type hole injection layer is composed of a P-type AlGaN / GaN superlattice layer grown at a low temperature and a P-type AlGaN / GaN superlattice layer grown at a high temperature LED epitaxial layer to solve the technical problems that the P-type electron blocking layer cannot effectively block some electrons from tunneling into the P-region to form carrier leakage and the traditional high-temperature P-type hole injection layer growth conditions cause damage to the MQW layer.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • LED epitaxial layer growth method for improving luminous efficiency and LED epitaxial layer
  • LED epitaxial layer growth method for improving luminous efficiency and LED epitaxial layer
  • LED epitaxial layer growth method for improving luminous efficiency and LED epitaxial layer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0047] see figure 2 , the present invention uses Aixtron MOCVD to grow high-brightness GaN-based LED epitaxial wafers. Using high-purity H 2 or high purity N 2 or high purity H 2 and high purity N 2 The mixed gas as the carrier gas, high-purity NH 3 As the N source, the metal-organic source trimethylgallium (TMGa), triethylgallium (TEGa) is used as the gallium source, trimethylindium (TMIn) is used as the indium source, and the N-type dopant is silane (SiH 4 ), trimethylaluminum (TMAl) as the aluminum source, and the P-type dopant as magnesium dicene (CP 2 Mg), the substrate is (0001) sapphire, and the reaction pressure is between 100mbar and 800mbar.

[0048] A LED epitaxial layer growth method for improving luminous efficiency, which sequentially includes processing a substrate, growing a low-temperature buffer GaN layer, growing a non-doped GaN layer, growing a Si-doped GaN layer, growing an active layer MQW, growing a P-type AlInGaN layer, The step of growing a P-t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an LED epitaxial layer growth method for improving luminous efficiency and an LED epitaxial layer. A P type hole injection layer comprises a first double-layer unit and a second double-layer unit. The first double-layer unit comprises a first AlGaN layer and a first GaN layer, the thickness of the first AlGaN layer and the first GaN layer ranges from 2 nm to 5 nm, the ratio of the first AlGaN layer to the first GaN layer in one period ranges from 1:1 to 3:1, and the period ranges from 5 to 10. The second double-layer unit comprises a second AlGaN layer and a second GaN layer, the thickness of the second AlGaN layer and the second GaN layer ranges from 2 nm to 5 nm, the ratio of the second AlGaN layer to the second GaN layer in one period ranges from 1:1 to 3:1, and the period ranges from 5 to 10. The P type hole injection layer is formed by a P type AlGaN / GaN superlattice layer which grows at a low temperature and a P type AlGaN / GaN superlattice layer which grows at a high temperature, the Droop effect of an LED chip under the high current density condition is effectively reduced, injection efficiency of charge curriers is improved, and luminous efficiency of devices is improved.

Description

technical field [0001] The invention relates to the technical field of LED epitaxial design, in particular to a method for growing an LED epitaxial layer with an improved P-type hole injection layer structure and the LED epitaxial layer. Background technique [0002] LEDs are widely used in a wide range of fields such as display screens, sensors, communications, and lighting. As the core semiconductor device, GaN-based blue LEDs can be combined with phosphors to produce white light, which is very attractive in terms of lighting. [0003] In the preparation of the GaN-based LED epitaxial layer, the characteristics of the P-type hole injection layer is an important factor affecting the electrical properties of the LED. The existing P-type GaN preparation technology has greatly increased the Mg doping concentration (up to E20 order of magnitude), but there is a phenomenon that the mobility is low when the doping concentration is too high. Moreover, too high doping of Mg will ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L33/00H01L33/32
CPCH01L33/0066H01L33/0075H01L33/04
Inventor 田艳红马欢
Owner XIANGNENG HUALEI OPTOELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products