High-precision automatic transistor test parameter acquisition system

Abstract

The invention discloses a high-precision automatic transistor test parameter acquisition system which can be used for not only automatically acquiring and analyzing the pressure and temperature change of a transistor, but also testing the electric property of the transistor. The high-precision automatic transistor test parameter acquisition system comprises a servo motor force applying mechanism, a testing circuit, a constant-temperature heat radiation table, a temperature and pressure sensor, an information acquisition and comparison system, wherein temperature testing system control program software and man-machine interface software are both developed independently, and the problem that an existing thermal resistance testing device cannot automatically test and acquire the pressure of a transistor and the temperature of a transistor shell; the testing temperature of the temperature sensor within small area can meet the requirement on precision of 0.1 DEG C, and the difficulty in testing the surface temperature of the transistor shell is solved; the automatic pressure applying system consists of a pressure sensor, a buffer, a stepping microspur unit and a heat insulation device, and can ensure that in a pressure applying process, not only can the appearance of the transistor not be damaged and the device heating not be affected by a mechanism, but also pressure can be increased slowly with the precision of 0.1%.

Description

technical field [0001] The invention belongs to the technical field of optical-mechanical-electrical integration, in particular to a high-precision automatic transistor temperature test and acquisition system. Background technique [0002] The reliability of the transistor is inherent in the product itself, and its reliability is closely related to whether the original design is reasonable and whether the process quality control is strict. However, due to the potential defects caused by various factors that are inevitable in the mass production process, such as: some changes in raw materials, equipment conditions and related process conditions, the transistors manufactured in this way, even with reasonable original design and good process Control, nor can it guarantee that the produced devices fully meet the requirements of the specification. Therefore, it is an indispensable and important process to improve the reliability of transistors by conducting sufficient reliabilit...

AI Technical Summary

Problems solved by technology

[0004] At present, the analysis and research on the temperature and pressure changes of transistors in China mainly adopts manual operation and manual data recording, and there is no R&D and production enterprise for the automatic acquisition system of pressure and temperature of transistors.

Images