Method for measuring IO3<-> by utilizing surface-enhanced Raman scattering spectrums

A technology of surface-enhanced Raman and spectrometry, applied in the field of analytical chemistry, to achieve good selectivity, high sensitivity, and good system stability

Inactive Publication Date: 2014-11-26
GUANGXI NORMAL UNIV
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Problems solved by technology

The preparation of these active substrates is mostly made of metal, glass, etc. as the base layer and then covered with nanoparticles. The preparation process of this substrate is cumbersome and has poor repeatability. Therefore, it is very difficult to use the solution directly as the SERS active substrate to realize the quantitative detection of substances. necessary

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  • Method for measuring IO3&lt;-&gt; by utilizing surface-enhanced Raman scattering spectrums

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Embodiment

[0020] Determination of IO by Surface-Enhanced Raman Scattering Spectroscopy 3 - method, including the following steps:

[0021] (1) Prepare a known concentration of IO 3 - Standard test system: Add 150 μL 31.7 mmol / L pH 2.8 Na in turn to a graduated test tube 2 HPO 4 - Citric acid buffer solution, 400 μL 0.02 mol / L KI solution, then add 4 μL, 20 μL, 40 μL, 60 μL, 80 μL 100 μmol / L KIO 3 Standard solution, and 100 μL 5.0 μmol / L VBB solution, 500 μL 47.82 μg / mL nano-gold sol, 100 μL 1.0 mol / L NaCl solution, mix well, and dilute to 2.0 mL with twice distilled water;

[0022] (2) Prepare according to the method of step (1) without adding KIO 3 Standard solution, prepare blank control system;

[0023] (3) Take the solutions of the above systems and place them in quartz cuvettes respectively. On the DXR smart Raman spectrometer, set the instrument parameters, the optical power is 3.0 mW, the acquisition time is 3s, and the surface-enhanced Raman of the system is obtained by...

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Abstract

The invention discloses a method for measuring IO3<-> by utilizing surface-enhanced Raman scattering spectrums. The method comprises the steps of (1) preparing an analytic solution with known concentration being IO3<->, and measuring the intensity value I of surface-enhanced Raman scattering peaks at the 1609cm<-1> position; (2) preparing a blank control system without containing a KIO3 standard solution, and measuring the intensity value I0 of the surface-enhanced Raman scattering peaks of the blank control system; (3) calculating according to a formula, namely delta I=I0-I; (4) making a working curve according to the concentration C of the IO3<-> to the delta I; (5) preparing the analytic solution of a measured sample, measuring the intensity value of the surface-enhanced Raman scattering peak as a sample I, and calculating according to a formula, namely delta I sample=I0-sample I; and (6) according to the working curve, calculating the concentration of the IO3<-> in the measured sample. Compared with the existing method, the method disclosed by the invention has the advantages of simplicity in operation, high sensitivity, good selectivity and good system stability.

Description

technical field [0001] The invention relates to the field of analytical chemistry, in particular to a method for measuring iodate by surface-enhanced Raman scattering spectroscopy. Background technique . [0002] Iodine is one of the essential trace elements for the human body, lack of iodine can cause various diseases. In order to prevent and control iodine deficiency disorders, the easiest way is to insist on eating qualified iodized salt and prevent them by increasing the body's iodine intake. For this reason, the state mandates that a certain amount of KIO must be added to table salt. 3 . Therefore, it is necessary to determine the iodine content in table salt. The determination methods of iodine include spectrophotometry, chemiluminescence, chromatography, electrochemical method, atomic spectrometry and so on. Surface-enhanced Raman spectroscopy (SERS) has the characteristics of rich information, rapid sensitivity, and high selectivity, and is widely used in qualit...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/65
Inventor 梁爱惠王耀辉张杏辉蒋治良
Owner GUANGXI NORMAL UNIV
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