Method for growing LED epitaxial structure with high-quality InGaN/GaN active layer
A technology of epitaxial structure and growth method, applied in electrical components, circuits, semiconductor devices, etc., can solve problems such as reducing luminous efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0056] like figure 1 As shown, the present invention discloses an LED epitaxial structure with a high-quality InGaN / GaN active layer, on which a buffer layer 2, an unintentionally doped layer 3, an N-type doped layer 4, and a stress balance layer are sequentially grown on a substrate 1. Layer 5, In x Ga 1-x N / GaN active layer 6, hole injection layer 7, electron blocking layer 8 and P-type doped layer 9; In x Ga 1-x The N / GaN active layer 6 is composed of multiple sets of GaN quantum barrier layers 61 and In x Ga 1-x N quantum well layer 62 is formed. In each set of GaN quantum barrier layers 61 and In x Ga 1-x A GaN protective layer 63 is grown between the N quantum well layers 62 .
[0057] The present invention also discloses a method for growing an LED epitaxial structure with a high-quality InGaN / GaN active layer. On a substrate 1, a buffer layer 2, an unintentionally doped layer 3, an N-type doped layer 4, a stressed Balance layer 5, In x Ga 1-x N / GaN active la...
Embodiment 2
[0076] The difference from Embodiment 1 is that: Figure 5 As shown, a GaN / InGaN superlattice layer 10 is grown between the hole injection layer 7 and the electron blocking layer 8, through the growth of the superlattice layer 10, the crystal quality and hole concentration can be further improved.
[0077] In this embodiment, a method for growing an LED epitaxial structure with a high-quality InGaN / GaN active layer, a buffer layer 2, an unintentionally doped layer 3, an N-type doped layer 4, and a stress balance layer are sequentially grown on a substrate 1. Layer 5, In x Ga 1-x N / GaN active layer 6, hole injection layer 7, electron blocking layer 8 and P-type doped layer 9, GaN / InGaN superlattice layer 10 is grown between hole injection layer 7 and electron blocking layer 8; wherein, In x Ga 1-x The growth of N / GaN active layer 6 comprises the following steps:
[0078] Using MOCVD equipment to epitaxially grow high-brightness green light-emitting diodes, a 2-inch c-plane...
PUM
Property | Measurement | Unit |
---|---|---|
Thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com