Super-resolution device and method based on pumping-probe technology

Abstract

The invention discloses a super-resolution method based on a pumping-probe technology. The super-resolution method is characterized in that a first light beam irradiates a sample and the atoms of the sample are transitioned to an excited state, a second light beam forms hollow light spots on the sample after phase modulation and excites signal light, and a third light beam forms hollow light spots on the sample and excites signal light. The super-resolution method comprises the following steps: controlling the frequency of the third light beam to be V1, detecting the signal light with the frequency being V1 and obtaining a first signal light intensity I1(x, y); controlling the frequency of the second light beam to be V2, detecting the signal light with the frequency being V1 and obtaining a second signal light intensity I2(x, y); and calculating effective signal light intensity I (x, y) at all scanning points, wherein x and y are two-dimensional coordinates of the scanning points, thus obtaining a super-resolution microscopic image. The invention also discloses a super-resolution device based on a pumping-probe technology. The super-resolution method and the super-resolution device have the advantages that the imaging speed is high, differentiated images can be scanned simultaneously, and the stimulated radiation is faster than spontaneous radiation of the original method.

Description

technical field [0001] The invention belongs to the field of super-resolution, in particular to a fast pump-probe technology-based super-resolution microscopy method and device. Background technique [0002] Due to the effect of diffraction from the optical system, there is a limit to the resolution achievable by conventional far-field optical microscopy methods. According to Abbe's diffraction limit theory, the size of the spot formed by the beam focused by the microscope objective lens is expressed as Where λ is the operating wavelength of the microscope, and NA is the numerical aperture of the microscope objective used. Therefore, the limiting resolution of conventional far-field optical microscopes is generally limited to about half a wavelength. [0003] Pump-probe (Pump-probe) technology As a standard nonlinear measurement tool, the Pump-probe technology has existed for decades, and it is used to characterize the photoinduced optical change characteristics of the ex...

AI Technical Summary

Problems solved by technology

Among them, the resolution of STED microscopy is determined by the optical power of the added loss light. Therefore, when achieving high resolution, the required optical power is very strong, which easily leads to the bleaching of fluorescent molecules.

In addition, the system of STED microscopy is relatively complicated, and the cost is generally relatively high.

SIM microscopy does not require high optical power, but due to the need for raster scanning, the imaging speed is slow and the imaging system is relatively complicated.

The imaging speed of STORM microscopy is also very slow, and it is currently difficult to apply it to the real-time detection of living cells

Although FED microscopy has improved compared to before, it needs to be scanned twice before and after to form hollow and solid images, and the imaging speed is relatively slow

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