GaAs thin film growing on Si substrate and method for preparing same
A substrate and thin film technology, applied in the field of GaAs thin films and their preparation, can solve problems affecting the surface flatness of GaAs semiconductor devices, etc., and achieve a simplified buffer layer structure and an epitaxial growth process, the technical means are simple and feasible, and the epitaxial growth process is simplified Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0036] The preparation method of the GaAs thin film grown on the Si substrate of the present embodiment comprises the following steps:
[0037] (1) Si substrate cleaning: After washing with acetone and deionized water, organic matter on the surface of the substrate is removed; the Si substrate is placed in HF:H 2 Ultrasound in O=1:10 solution for 1 minute, then rinse with deionized water to remove surface oxides and organic matter; dry the cleaned Si substrate with high-purity nitrogen;
[0038] (2) Si substrate pretreatment: After the Si substrate is cleaned, send it to the molecular beam epitaxy sampling chamber for pre-degassing for 15 minutes; then send it to the transfer chamber for degassing at 300°C for 2 hours, and send it to the growth chamber after degassing;
[0039] (3) Deoxidation film on Si substrate: After Si substrate enters the growth chamber, raise the substrate temperature to 950-1050°C, bake at high temperature for 15-30 minutes, and remove the oxide film l...
Embodiment 2
[0047] The preparation method of the GaAs thin film grown on the Si substrate of the present embodiment comprises the following steps:
[0048] (1) Si substrate cleaning: After washing with acetone and deionized water, organic matter on the surface of the substrate is removed; the Si substrate is placed in HF:H 2 Ultrasonic in O=1:10 solution for 10 minutes, then rinsed with deionized water to remove surface oxides and organic matter; the cleaned Si substrate was dried with high-purity nitrogen;
[0049] (2) Si substrate pretreatment: After the Si substrate is cleaned, send it to the molecular beam epitaxy sampling chamber for pre-degassing for 30 minutes; then send it to the transfer chamber for degassing at 400°C for 0.5 hours, and then send it to the growth chamber after degassing;
[0050] (3) Si substrate deoxidation film: after the Si substrate enters the growth chamber, the temperature of the substrate is raised to 1050 ° C, and the high temperature is baked for 30 minu...
PUM
Property | Measurement | Unit |
---|---|---|
thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com