Polycrystalline silicon ingot and production method thereof
A technology of polycrystalline silicon ingots and seed crystals, applied in the field of polycrystalline silicon ingots and its preparation, can solve the problems of high crystal defect density, reduced electrical performance, and unstable crystallization direction in the edge area of silicon ingots, so as to reduce the defect density and impurities of silicon crystals content, reduce crystal defects, the effect of reasonable and easy method
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Embodiment 1
[0029] A method for preparing a polycrystalline silicon ingot, comprising the following steps:
[0030] (1) In the center of the bottom of the crucible, the average dislocation density is 1×10 3 / cm 2 common seed crystals to form a first seed layer with a thickness of 3 cm, and then lay an average dislocation density of 1×10 6 / cm 2 The seed crystal with high-density crystal defects forms a second seed crystal layer with a width of 3 cm and a thickness of 3 cm; the second seed crystal layer is formed around the first seed crystal layer, and the first seed crystal layer and the second seed crystal layer completely cover the bottom of the crucible;
[0031] figure 2 It is a schematic diagram of laying the first seed layer and the second seed layer on the bottom of the crucible in the present invention, wherein 1 is the crucible, 2 is the first seed layer, 3 is the second seed layer, and 4 is silicon material.
[0032] (2) setting molten silicon material on the first seed c...
Embodiment 2
[0040] A method for preparing a polycrystalline silicon ingot, comprising the following steps:
[0041] (1) In the center of the bottom of the crucible, the average dislocation density is 1×10 3 / cm 2 Common seed crystals form a first seed layer with a thickness of 2cm, and then lay an average dislocation density of 1×10 6 / cm 2 A seed crystal with a high density of crystal defects forms a second seed crystal layer with a width of 2 cm and a thickness of 2 cm; the second seed crystal layer is formed around the first seed crystal layer, and the first seed crystal layer and the second seed crystal layer completely cover the bottom of the crucible;
[0042] (2) setting molten silicon material on the first seed crystal layer and the second seed crystal layer, controlling the temperature at the bottom of the crucible so that the first seed crystal layer and the second seed crystal layer are not completely melted;
[0043] (3) Control the thermal field in the crucible to form a ...
Embodiment 3
[0046] A method for preparing a polycrystalline silicon ingot, comprising the following steps:
[0047] (1) In the center of the bottom of the crucible, the average dislocation density is 1×10 3 / cm 2 Ordinary seed crystals form a first seed layer with a thickness of 3 cm, and lay an average dislocation density of 1×10 on the bottom of the crucible near the side wall 6 / cm 2 A seed crystal with a high density of crystal defects forms a second seed layer with a width of 3 cm and a thickness of 2 cm; and then lays an average dislocation density of 1×10 on the second seed layer. 3 / cm 2 The ordinary seed crystal formation width is 3cm, the third seed crystal layer is 1cm thick, the second seed crystal layer and the third seed crystal layer are formed around the first seed crystal layer, and the first seed crystal layer and the second seed crystal layer are completely Cover the bottom of the crucible;
[0048] (2) setting molten silicon material on the first seed crystal laye...
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