Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Direct contact tensile deformation measurement system and measurement method under high temperature and oxygen-free environment

A tensile deformation, high temperature and oxygen-free technology, which is applied in the direction of electric/magnetic solid deformation measurement, measurement devices, electromagnetic measurement devices, etc., can solve the problems that non-contact high-temperature extensometers cannot be calibrated and have many limitations, and achieve mechanical No loss of performance, guaranteed measurement accuracy, and the effect of eliminating heat

Active Publication Date: 2019-05-24
AEROSPACE RES INST OF MATERIAL & PROCESSING TECH +1
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are many limitations. At present, the relatively stable test temperature can only reach 1200°C, and different filter lenses are used for different materials and temperature ranges, and non-contact high-temperature extensometers cannot be calibrated.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Direct contact tensile deformation measurement system and measurement method under high temperature and oxygen-free environment
  • Direct contact tensile deformation measurement system and measurement method under high temperature and oxygen-free environment
  • Direct contact tensile deformation measurement system and measurement method under high temperature and oxygen-free environment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The present invention will be further described in detail below in conjunction with the drawings and specific embodiments:

[0037] Such as figure 1 Shown is a schematic diagram of a high-temperature tensile performance test system. From the figure, it can be seen that a direct-contact tensile deformation measurement system in a high-temperature, oxygen-free environment includes an environmental box 1, a radiation furnace 2, a tensile fixture 3, and a tensile sample 4 , The first extensometer water-cooled box 5, the second extensometer water-cooled box 6, the extensometer transfer rod 7, the first support adjustment device 8, the second support adjustment device 9, the elastic element and the strain gauge 10, the signal line 11, the first Fixed board 12, second fixed board 13, aviation plug 14, signal amplifier converter 15 and display 16;

[0038] Radiant furnace 2, stretching fixture 3, tensile specimen 4, first extensometer water-cooled box 5, second extensometer water-co...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
Sensitivityaaaaaaaaaa
Login to View More

Abstract

The invention provides a direct contact type stretching deformation measuring system in a high-temperature oxygen-free environment, and relates to the field of stretching deformation measurement in the high-temperature oxygen-free environment. The system comprises an environment casing, a radiation furnace, stretching clamps, a stretching sample, a first extensometer water cooling box, a second extensometer water cooling box, extensometer transmission rods, a first support adjusting device, a second support adjusting devices, elastic components and foil gauges, a signal line, a first fixed plate, a second fixed plate, an aviation plug, a signal amplification converter and a display. A direct contact type measuring method can be used to transmit deformation of the sample to the elastic components accurately, and the sensitivity is higher; and the test temperature can reach 2000 DEG C, the elastic components and foil gauges are kept below 50 DEG C always, and an extensometer can be calibrated in normal temperature and used in the high temperature environment.

Description

Technical field [0001] The invention relates to the field of measuring tensile deformation of materials in a high-temperature oxygen-free environment; in particular, it relates to a direct contact type tensile deformation measurement system and a measurement method in a high-temperature oxygen-free environment. Background technique [0002] With the improvement of the performance of aerospace vehicles, traditional materials can no longer meet the design requirements. The related industries have introduced a series of new materials that meet the design requirements through research and technological improvement, and put forward higher requirements for the performance indicators of the new materials. The characterization of mechanical behavior under the use environment is an important index to evaluate the reliability of materials. Among them, the tensile performance test of high temperature oxygen-free environment is the most basic evaluation method. [0003] The high-temperature m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B7/16G01N3/08
CPCG01B7/18G01N3/08G01N2203/0017G01N2203/0075
Inventor 李西颜卢克非章妮张涛王晓薇
Owner AEROSPACE RES INST OF MATERIAL & PROCESSING TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products