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One-step chemical grafting of organic insulating films in through-silicon vias

A technology of organic insulating film and chemical grafting, applied in the field of semiconductor chip packaging, can solve problems such as being difficult to realize, and achieve the effect of low cost

Active Publication Date: 2018-11-16
SHANGHAI JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This process usually needs to be carried out in an organic medium, which is not easy to achieve in industrial production

Method used

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  • One-step chemical grafting of organic insulating films in through-silicon vias

Examples

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Embodiment 1

[0026] This example involves a method of chemically grafting an organic insulating film in a through-silicon via in one step, and the specific steps are as follows:

[0027] Step (1) Ultrasonic cleaning of p-type thin slices with TSVs having a resistivity of 50 Ω / m, a pore diameter of 100 μm, and a pore depth of 200 μm in acetone, alcohol, and deionized water for 10 minutes;

[0028] Step (2) configuration electrolytic solution, wherein has the sodium dodecylsulfonate of 5g / L, the hydrochloric acid of 0.5mol / L, the acrylic acid of 0.5mol / L, the pyrazole diazonium inner salt of 1g / L, 1mol / L of sodium fluoride. The pH value of the electrolyte solution is 1.

[0029] Step (3) Place the silicon wafer in step (1) in the electrolyte solution in step (2) for 5h, the temperature is controlled at 25°C, no need to add any instrument, measure its cross section as figure 1 As shown, an organic insulating film 1 is grafted on the TSV 2 . in F - Under the action of ions, an organic film...

Embodiment 2

[0031] This example involves a method of chemically grafting an organic insulating film in a through-silicon via in one step, and the specific steps are as follows:

[0032] Step (1) Ultrasonic cleaning of p-type thin slices with TSVs having a resistivity of 500Ω / m, a pore diameter of 200 μm, and a pore depth of 300 μm in acetone, alcohol, and deionized water for 10 minutes;

[0033] Step (2) configures the electrolyte solution, wherein there are 10g / L sodium dodecylsulfonate, 0.55mol / L hydrochloric acid, 1mol / L trifluoroethyl methacrylate, 2g / L pyrazole diazo Salt, 2mol / L hydrofluoric acid. The pH value of the electrolyte solution is 2.

[0034] Step (3) Place the silicon wafer in step (1) in the electrolyte solution in step (2) for 4 hours, the temperature is controlled at 23°C, no need to add any instrument, measure its cross section as figure 1 shown. in F - Under the action of ions, an organic film with a 400nm inner wall and a 600nm bottom is obtained, with a breakdo...

Embodiment 3

[0036] This example involves a method for chemically grafting an organic insulating film in a through-silicon via in one step, and the specific steps are as follows:

[0037] Step (1) n-type, the uniform doping concentration of impurities is 200 / cm 3 , the resistivity is 5Ω / m, the pore diameter is 300μm, and the hole depth is 200μm. The thin silicon wafer with silicon vias is cleaned in acetone, alcohol, and deionized water for 10 minutes;

[0038] Step (2) configures electrolytic solution, wherein has the sulfated castor oil of 20g / L, the hydrochloric acid of 0.6mol / L, the trifluoroethyl methacrylate of 0.5mol / L, the triptycene diazonium salt of 5g / L, 3mol / L sodium fluoride. The pH value of the electrolyte solution is 3.

[0039] Step (3) Place the silicon wafer in step (1) in the electrolyte solution in step (2) for 3h, the temperature is controlled at 20°C, no need to add any instrument, measure its cross section as figure 1 shown. in F - Under the action of ions, an o...

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Abstract

The invention provides a method for one-step-method chemical grafting of an organic insulation membrane in a silicon through hole. The method includes the following steps that a silicon wafer with a silicon through hole is pretreated and is put in an electrolyte solution for chemical plating; the electrolyte solution contains a surfactant with the concentration of no more than 20 g / L, an organic monomer with the concentration not exceeding its solubility, diazonium salt with the concentration of 0.1-10 g / L and fluorine ions with the concentration of 0.1-8 mol / L. Under the effect of F- ions, a uniform organic membrane having better shape-holding nature and large depth-width ratio can be prepared on the wall in the silicon through hole without other additional devices and temperature conditions by adopting the method. In addition, the steps are easy to operate, the cost is lower, and the method is suitable for semiconductor industry and industrial production.

Description

technical field [0001] The invention relates to the field of semiconductor chip packaging, in particular to a method for chemically grafting an organic insulating film in a through-silicon hole in one step. Background technique [0002] Coating silicon surfaces with organic polymers is of great benefit in many fields, especially in semiconductor fields such as microelectronics, biosensors and molecular electronics. In recent years, the fourth-generation three-dimensional packaging, that is, through-silicon via technology, or TSV technology for short, has become a research hotspot. Therefore, the preparation of organic films in TSVs has become a very important experimental topic. Electrochemical deposition of diazonium salts in TSVs is very popular, because this method can be carried out in solution, easy to implement in industrial production, less consumables, and has broad application prospects in the future. [0003] In the literature, the spin-coating method is widely a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C08F292/00C08F220/06C08F220/22C08F220/24C08F220/14
CPCC08F292/00C08F220/06C08F220/22
Inventor 张珊珊李明高兰雅张俊红
Owner SHANGHAI JIAOTONG UNIV