Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Vacuum ultraviolet LED junction temperature and radiation measuring system based on integrating sphere

A technology of vacuum ultraviolet and ultraviolet radiation, applied in the direction of diode testing, single semiconductor device testing, etc., can solve the problems of low radiation efficiency, no LED junction temperature measurement device, etc., achieve obvious constant temperature effect and improve measurement accuracy , the effect of preventing absorption

Active Publication Date: 2017-03-15
上海复展智能科技股份有限公司 +1
View PDF11 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the low radiation efficiency of vacuum ultraviolet LEDs at present, most of the input electric power becomes heat energy, and good cooling measures are required to control the junction temperature
At present, the vacuum photometric integrating sphere is for gas discharge lamps, and there is no LED junction temperature measurement device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Vacuum ultraviolet LED junction temperature and radiation measuring system based on integrating sphere
  • Vacuum ultraviolet LED junction temperature and radiation measuring system based on integrating sphere

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments. The described embodiments are only some of the embodiments of the invention. All other embodiments without creative achievements based on the embodiments of the present invention belong to the protection scope of the present invention.

[0019] Vacuum UV LED junction temperature and UV radiation measurement system based on integrating sphere, such as figure 1 As shown, including the external bearing ball 1, the whole system is connected with the measurement circuit and the drive circuit below through aviation plugs 1-3. The ultraviolet measurement device includes an internal high vacuum integrating sphere 2 and a vacuum ultraviolet light detection device installed on the side wall, and is connected to an external data processing system through an aviation plug. The vacuum ultraviolet light detection device includes vacuum ultraviolet power mete...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of semiconductor lighting devices, and specifically relates to a vacuum ultraviolet LED junction temperature and ultraviolet radiation measuring system based on an integrating sphere. The measuring system comprises an external bearing sphere which can be pumped to a low-vacuum state, an internal integrating sphere which can be pumped to a high-vacuum state, a constant temperature device, a measuring circuit, and a driving circuit. The bearing sphere and the integrating sphere are electrically connected by an aviation plug. The side wall of the internal integrating sphere is equipped with a standard lamp, a vacuum ultraviolet power meter probe and a vacuum ultraviolet spectrometer, and can measure the radiation flux and the spectrum of a vacuum ultraviolet LED. The constant temperature device is connected with a temperature feedback system and a computer control system, and can control the temperature accurately and quickly. The advantage lies in that the parameters of a vacuum ultraviolet LED, such as spectral power distribution, radiation flux, electric power, thermal power and junction temperature, can be measured simultaneously under constant junction temperature, and test is highly repeatable.

Description

technical field [0001] The invention belongs to the technical field of semiconductor lighting devices, and relates to a measurement device, in particular to a vacuum ultraviolet LED junction temperature and radiation measurement system based on an integrating sphere. Background technique [0002] Vacuum ultraviolet (VUV) is an electromagnetic wave with a wavelength of 10−200 nm. VUV is strongly absorbed by oxygen in the air and can only propagate in a vacuum, hence the name. Because the photon energy of vacuum ultraviolet greatly exceeds the bond energy of all chemical bonds in organic molecules, it can produce photochemical reactions, and has many applications in sterilization, pollution treatment, and surface modification. [0003] With the gradual expansion of the research field of semiconductor light sources, it has been found that wide-bandgap semiconductors can emit vacuum ultraviolet radiation with a wavelength below 200 nm. For example, the bandgap of AlN is 6.2 eV, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2635
Inventor 李福生李明昊韩秋漪胡云龙张善端
Owner 上海复展智能科技股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products