Foreign particle concentration measuring system for J-TEXT Tokamak device

A technology for measurement of impurity particles and concentration, applied in X-ray energy spectrum distribution measurement, etc., can solve the problems of different radiation energy peaks, occupying many diagnostic interfaces, and different measurement voltages, achieving high sensitivity, high real-time performance, and accurate measurement degree of effect

Inactive Publication Date: 2017-04-26
HUAZHONG UNIV OF SCI & TECH
View PDF6 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The impurity particle concentration measurement of the existing tokamak device is to convert the X-ray optical signal of impurity particles into a voltage signal for acquisition and processing; different radiation energies correspond to different voltage signals, so that the particle radiation energy and voltage are one by one Linear correspondence, different im

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Foreign particle concentration measuring system for J-TEXT Tokamak device
  • Foreign particle concentration measuring system for J-TEXT Tokamak device
  • Foreign particle concentration measuring system for J-TEXT Tokamak device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0026] The J-TEXT tokamak device impurity particle concentration measurement system provided by the embodiment includes sequentially connected ray optical path modules, ray detection modules, pulse shaping and amplification modules, and MCA data processing modules; as figure 1 This J-TEXT Tokamak device provided for the embodiment is a schematic diagram of the connection between the measurement ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a foreign particle concentration measuring system for a J-TEXT Tokamak device. The foreign particle concentration measuring system comprises an X-ray optical path module, an X-ray detection module, a pulse shaping amplification module and an MCA data processing module. When the Tokamak device is cracked, a foreign gas is injected in order to suppress high-energy high-speed escape electrons, foreign particles may generate radiation and the impurity concentration is calibrated by measuring the impurity radiation intensity. Because a radiation energy pulse signal is weak, a high-sensitivity detector is used to detect the pulse signal and the high-gain pulse shaping amplification module is used to shape and amplify the pulse signal in order to output a voltage pulse signal with amplified amplitude. The MCA data processing module, according to the collected voltage pulse signal, performs energy spectrum analysis. Because different impurities have different radiation pulse peaks, the concentration of the various impurities can be determined according to the energy spectrum.

Description

technical field [0001] The invention belongs to the technical field of tokamak plasma operation impurity radiation, and more specifically relates to a J-TEXT tokamak device impurity particle concentration measurement system. Background technique [0002] Tokamak high-energy particle radiation can reflect the internal information of high-temperature plasma. The research on the behavior of fast electrons is mainly carried out through various radiations induced by fast electrons, including the down-shifting of the cyclotron radiation frequency caused by the relativistic effect of fast electrons, fast The bremsstrahlung and recombination radiation generated by the interaction between electrons and plasma; the research on the root-line radiation mechanism can obtain the density and core state of heavy impurities. [0003] The impurity particle concentration measurement of the existing tokamak device is to convert the X-ray optical signal of the impurity particle into a voltage si...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01T1/36
CPCG01T1/36
Inventor 陈忠勇高海龙徐涛
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap