Foreign particle concentration measuring system for J-TEXT Tokamak device

Abstract

The invention discloses a foreign particle concentration measuring system for a J-TEXT Tokamak device. The foreign particle concentration measuring system comprises an X-ray optical path module, an X-ray detection module, a pulse shaping amplification module and an MCA data processing module. When the Tokamak device is cracked, a foreign gas is injected in order to suppress high-energy high-speed escape electrons, foreign particles may generate radiation and the impurity concentration is calibrated by measuring the impurity radiation intensity. Because a radiation energy pulse signal is weak, a high-sensitivity detector is used to detect the pulse signal and the high-gain pulse shaping amplification module is used to shape and amplify the pulse signal in order to output a voltage pulse signal with amplified amplitude. The MCA data processing module, according to the collected voltage pulse signal, performs energy spectrum analysis. Because different impurities have different radiation pulse peaks, the concentration of the various impurities can be determined according to the energy spectrum.

Description

technical field [0001] The invention belongs to the technical field of tokamak plasma operation impurity radiation, and more specifically relates to a J-TEXT tokamak device impurity particle concentration measurement system. Background technique [0002] Tokamak high-energy particle radiation can reflect the internal information of high-temperature plasma. The research on the behavior of fast electrons is mainly carried out through various radiations induced by fast electrons, including the down-shifting of the cyclotron radiation frequency caused by the relativistic effect of fast electrons, fast The bremsstrahlung and recombination radiation generated by the interaction between electrons and plasma; the research on the root-line radiation mechanism can obtain the density and core state of heavy impurities. [0003] The impurity particle concentration measurement of the existing tokamak device is to convert the X-ray optical signal of the impurity particle into a voltage si...

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Problems solved by technology

[0003] The impurity particle concentration measurement of the existing tokamak device is to convert the X-ray optical signal of impurity particles into a voltage signal for acquisition and processing; different radiation energies correspond to different voltage signals, so that the particle radiation energy and voltage are one by one Linear correspondence, different impurity particles have different radiation intensities, different radiation energy peak values, and different measurement voltages; the concentration of impurity particles is quantified through data statistical processing; HT-7U (China) and HL-2A (China) both use multi-channel soft X-rays to measure and study plasma, occupying many diagnostic interfaces and costing a lot

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