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Method for analyzing metal elements in electronic waste

A technology of electronic waste and analysis method, which is applied in the field of analysis and testing, can solve the problems of mutual interference of elements, large residues, incomplete dissolution of non-metals, etc., and achieve the effect of ensuring accuracy and avoiding unstable analysis results

Inactive Publication Date: 2017-05-17
GREE ELECTRIC APPLIANCES INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] In the existing qualitative and quantitative determination methods for metal and non-metal substances in electronic waste, there are incomplete dissolution of non-metals, many residues, mutual interference of various elements, and organic components such as epoxy resin have a great impact on the analysis results. Inaccurate analysis results caused by the impact, etc., the present invention provides an analysis method for metal elements in electronic waste

Method used

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  • Method for analyzing metal elements in electronic waste
  • Method for analyzing metal elements in electronic waste
  • Method for analyzing metal elements in electronic waste

Examples

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Effect test

Embodiment 1

[0101] The present embodiment provides a method for analyzing metal elements in a computer motherboard, said method comprising the following steps:

[0102] (1) After the computer motherboard is mechanically crushed and screened, the powder particle size is kept between 80 meshes;

[0103] (2) Place the computer motherboard after mechanical crushing and sieving in step (1) in a high-temperature muffle furnace, maintain the temperature in the muffle furnace at 650° C. under a sufficient oxygen atmosphere, and keep the temperature for 6 hours to obtain a computer motherboard sample;

[0104] (3) Choose 10g of the computer motherboard sample in step (2), add concentration to be 65wt% concentrated nitric acid 20mL and let stand for 2h in the polytetrafluoroethylene digestion tank, then add HNO successively 3 10mL of concentrated aqua regia with a concentration of 35wt%, 5mL of hydrofluoric acid with a concentration of 45wt%, and 10mL of hydrogen peroxide with a concentration of 30...

Embodiment 2

[0110] The present embodiment provides a method for analyzing metal elements in a TV motherboard, said method comprising the following steps:

[0111] (1) After mechanically crushing and sieving the main board of the TV set, the particle size of the powder is kept between 120 mesh;

[0112] (2) Put the TV mainboard that has been mechanically crushed and screened in step (1) in a high-temperature muffle furnace, and keep the temperature in the muffle furnace at 450° C. for 1 hour under a sufficient oxygen atmosphere to obtain a TV Motherboard samples;

[0113] (3) Select 0.5g of the TV motherboard sample in step (2), add 5mL of concentrated nitric acid with a concentration of 65wt% in a polytetrafluoroethylene digestion tank and let it stand for 0.5h, then add HNO successively 3 The volume ratio of HCl and HCl is 1:3, 5mL of concentrated aqua regia with a concentration of 30wt%, 0.5mL of hydrofluoric acid with a concentration of 45wt%, and 5mL of hydrogen peroxide with a conce...

Embodiment 3

[0119] The present embodiment provides a method for analyzing metal elements in a mainboard of a mobile phone, said method comprising the following steps:

[0120] (1) After the main board of the mobile phone is mechanically crushed and screened, the powder particle size is kept between 200 mesh;

[0121] (2) Place the mobile phone main board that has been mechanically crushed and screened in step (1) in a high-temperature muffle furnace, and keep the temperature in the muffle furnace at 850°C under a sufficient oxygen atmosphere, and keep it warm for 3 hours to obtain a mobile phone main board sample ;

[0122] (3) Select 5g of the mobile phone motherboard sample in step (2), add 10mL of concentrated nitric acid with a concentration of 65wt% in a polytetrafluoroethylene digestion tank and let it stand for 12h, then add HNO 3 2mL of concentrated aqua regia with a concentration of 30wt%, 0.5mL of hydrofluoric acid with a concentration of 45wt%, and 5mL of hydrogen peroxide wit...

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Abstract

The invention provides a method for analyzing metal elements in electronic waste. The method comprises the following steps: performing aerobic roasting on pre-treated electronic waste to obtain a waste sample; taking the waste sample and dissolving the waste sample with acid, performing heating digestion with a first kind mixed acid, and performing cooling, filtration and constant volume setting to obtain a first kind metal ionic mixed solution; taking the waste sample and dissolving the waste sample with acid, carrying out a reaction with a second kind mixed acid, performing heating for evaporation, dissolving the residue with acid, and performing cooling, filtration and constant volume setting to obtain a second kind metal ionic mixed solution; taking the pre-treated electronic waste and dissolving the pre-treated electronic waste with acid, performing heating digestion with a third kind mixed acid, and performing cooling, filtration and constant volume setting to obtain a third kind metal ionic mixed solution; and measuring the content of metal elements in each metal ionic mixed solution. Through adoption of aerobic high-temperature treatment combining with heating digestion, to-be-measured metal elements are dissolved from the electronic waste, so that the content of metal ions in the electronic waste is accurately measured.

Description

technical field [0001] The invention belongs to the field of analysis and testing, and relates to an analysis method for metal elements, in particular to an analysis method for metal elements in electronic waste. Background technique [0002] Discarded circuit boards in electronic waste are a typical type of electronic waste rich in metals with complex composition and structure, because they contain many types of metals, are prone to spectral line interference, and also contain a large number of non-metallic components. The accurate determination of the content of metal elements will have an impact, so it is difficult to achieve the purpose of accurate analysis by a single analysis process or a single analysis method. [0003] CN 104178629A discloses a method for recovering valuable metals from waste electronic circuit board polymetallic powder, including the following steps: (1) leaching: using waste electronic circuit board polymetallic powder as raw material, and using ni...

Claims

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Application Information

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IPC IPC(8): G01N1/44G01N1/40G01N1/28
CPCG01N1/44G01N1/286G01N1/4022G01N1/4044G01N1/4055G01N2001/2866G01N2001/4027G01N2001/4061
Inventor 康露周文斌郭鸿钊刘劲业吴钦文王九飙石秋成王红霞
Owner GREE ELECTRIC APPLIANCES INC
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